Unlock instant, AI-driven research and patent intelligence for your innovation.

Semiconductor nano structure and its preparing method

A nanostructure and manufacturing method technology, applied in the direction of semiconductor devices, final product manufacturing, sustainable manufacturing/processing, etc., can solve the problems of reducing the probability of radiation recombination, small adjustable range, and influence of nano-island temperature characteristics

Inactive Publication Date: 2007-08-29
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
View PDF0 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When dislocations exist, electrons and holes can undergo non-radiative recombination, thereby reducing the probability of radiative recombination and reducing the luminous efficiency of nano-islands; similarly, the temperature characteristics of nano-islands will also be affected
It is also not good for making electronic devices
[0011] (2) The photolithography method also has the disadvantages of complex process and high cost. When the lithography line width needs to be reduced, the process cost will be greatly increased, and the process is more complicated, resulting in a decrease in yield
[0012] (3) The disadvantage of using surface pits to grow nano-islands is that nano-islands and their array structures irrelevant to substrate surface pits cannot be formed on various required substrate surfaces, which makes its application difficult. big limitations
[0013] (4) The disadvantages of the self-assembled nano-island method are: since its growth mechanism utilizes the S-K growth mode, the size of the nano-island will be limited and the adjustable range is small; in addition, real-time monitoring must be used, which can only be done in molecular In the beam epitaxy (MBE) growth method, the

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor nano structure and its preparing method
  • Semiconductor nano structure and its preparing method
  • Semiconductor nano structure and its preparing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0059] In order to realize the purpose of the present invention, adopt following method:

[0060] There are currently three known epitaxial growth modes: F-vdM (Frank-var der Merwe) mode, V-M (Volmer-Webber) mode, and S-K (Stranski-Krastanov) mode. Whether the two-dimensional or three-dimensional growth mode dominates in the epitaxial growth process depends on the surface energy between the substrate, the interface and the epitaxial layer. When the sum of the surface energy and interface energy of the epitaxial layer is greater than the surface energy of the substrate, V-W growth occurs, that is, island growth, and then nano-islands can be formed. The purpose of passivating the substrate surface is to reduce the surface energy of the substrate surface. The first layer of nanometer-sized nano-islands deposited on the substrate is not used as an active layer, but is used as an adjustment layer by using the vertical coupling effect, and one or several layers of nano-island struc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

This invention relates to a semiconductor nm structure including: a substrate as a carrier of semiconductor devices, a semiconductor buffer layer formed on the substrate by an epitaxial growing technology to buffer the stress of the substrate and other layers, a template layer formed on the buffer layer by an epitaxial growing technology as a supporting template, a passivation layer formed on the template layer by surface passivation to adsorb atoms on a surface migration potential, an inducement layer formed on the passivation layer to promote form of a semiconductor nm island, an nm island layer formed on the inducement layer as an active agent of photoelectronic devices, a cover layer on the island layer for protecting it or providing carriers.

Description

technical field [0001] The invention relates to a semiconductor material and device and a manufacturing method thereof, in particular to a semiconductor nanostructure and a manufacturing method thereof. Background technique [0002] Semiconductor nanostructure involves the following content: divided by materials, it is III-V semiconductor materials, including III-V binary semiconductor materials and ternary and quaternary compound semiconductor materials composed of them; divided by system size, it is nanoscale , belonging to the research field of mesoscopic system and quantum system. According to the growth method, it includes metal-organic chemical vapor deposition, molecular beam epitaxy, atomic beam epitaxy, etc. as the representative superlattice epitaxial growth technology, that is, the epitaxial growth technology that can grow atomic-scale ultra-thin films, nanostructures and abrupt interfaces; According to the types of epitaxial materials, it includes heterogeneous ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L33/00H01L31/08H01L31/18H01L33/04
CPCY02P70/50
Inventor 陈振
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More