Flattening active driving TFT matrix structure and method of manufacture

A matrix structure, source-driven technology, applied in semiconductor/solid-state device manufacturing, electrical components, electric solid-state devices, etc., can solve the problems of broken metal wires, poor thermal stability, easy oxidation or corrosion of the surface, and reduce the number of metal wires Disconnection, reduced stress formation, and beneficial effects on yield

Active Publication Date: 2007-10-31
BEIJING BOE OPTOELECTRONCIS TECH CO LTD +1
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Problems solved by technology

However, pure Al and pure Cu still have many disadvantages as electrode materials. One is poor thermal stability, such as the surface of Al film is prone to serious hillock phenomenon after high temperature treatment; the other is poor chemical stability, and the surface is easy to oxidize or corrode.
In order to overcome these shortcomings, the electrode materials used more in large-screen and high-resolution liquid crystal displays are double-layer or multi-layer structures of Al and refractory metals Cr, Mo, etc., but this double-layer or multi-layer structure is greatly improved. The thickness of the gate metal electrode is increased to form obvious steps on the surface of the transparent substrate
This

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  • Flattening active driving TFT matrix structure and method of manufacture
  • Flattening active driving TFT matrix structure and method of manufacture
  • Flattening active driving TFT matrix structure and method of manufacture

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specific Embodiment 1

[0033] Fig. 1A-Fig. 1 E have shown the technological method of preparation planarization TFT matrix structure that the present invention proposes

[0034] First, on a transparent glass substrate or quartz 11, a gate metal layer 12 with a thickness of about 100-3000 Ȧ is deposited by sputtering or thermal evaporation. The gate metal layer can adopt a single-layer, double-layer or multi-layer structure, and the metal can be selected from Cr, W, Ti, Ta, Mo, Al, Cu and other metals or their alloys. After the gate metal layer is deposited, a pattern of photoresist 13 is formed by a traditional photolithography process, wherein the photoresist is a positive photoresist, as shown in FIG. 1A . The unnecessary gate metal layer is etched away by wet or dry process to form gate lines and gate electrodes 16 , while the photoresist 13 on the gate lines and gate electrodes 16 is retained, as shown in FIG. 1B .

[0035] Secondly, on the transparent glass substrate or quartz 11 and photoresi...

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Abstract

The invention discloses a flat active drive TFT matrix configuration that comprises: base board, grating line, and gate electrode and gate insulation layer, it characterized in that: said grating line and gate electrode are covered onto the base board by the gate insulation layer, the upper surface of the gate insulation layer is flat, semiconductor layer, source electrode and drain electrode and pixel electrode are all formed on the gate insulation layer. The invention also discloses method of producing the flat active drive TFT matrix configuration. The flat insulation surface formed in the invention is propitious to aggradation of later active layer, source and drain metal layer, passivation layer and pixel electrode layer, and reduces the generation of metal fault line. At the same time, flat gate electrode insulation surface can reduce the form of inner stress of the gate insulation layer, and increase the ratio of the finished product.

Description

technical field [0001] The invention relates to an active driving thin film transistor (TFT) matrix structure and a manufacturing method thereof, in particular to a planarized active driving TFT matrix structure and a manufacturing method thereof. Background technique [0002] With the continuous increase of liquid crystal display screens and display pixels, high-resistivity metal materials can no longer meet the requirements of TFT matrix gate signal delay. Therefore, metals with lower resistivity such as Al, Cu, etc. become the first choice for TFT gate metal electrode materials. However, pure Al and pure Cu still have many disadvantages as electrode materials. One is poor thermal stability, such as the surface of Al film is prone to serious hillock phenomenon after high temperature treatment; the other is poor chemical stability, and the surface is easy to oxidize or corrode. In order to overcome these shortcomings, the electrode materials used more in large-screen and h...

Claims

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Application Information

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IPC IPC(8): H01L27/12H01L21/84
Inventor 王章涛邱海军陈旭闵泰烨林承武
Owner BEIJING BOE OPTOELECTRONCIS TECH CO LTD
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