Spatial processor single particle experiment automatized test system and method

An automated test and processor technology, applied in the direction of electronic circuit test, digital circuit test, electrical digital data processing, etc., can solve the problems of unable to record observation results in real time, single test vector, small observation window, etc., to improve flexibility and Configurable capabilities, improved reliability and confidence, and the effects of eliminating errors

Inactive Publication Date: 2008-10-15
BEIJING MXTRONICS CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Single-particle tests at home and abroad usually use external monitoring or manual operation, that is, to observe in the test system with an external logic analyzer, oscilloscope and ammeter in the irradiation environment. The disadvantage of this method is that the observation window is small and cannot Record the observation results in real time, and have relatively high requirements on the electrical performance of the test site and the entire test system.
Using the traditional method and using an oscilloscope to observe, only the logic of the peripheral interface can be observed, and the ability to observe internal flips is limited, so it is impossible to effectively evaluate the number of single event flips
[0003] The existing test method for high-performance spatial processors, the host computer monitoring, and the test mode of the computer under test, each round of tests can only target one test vector, which requires personnel monitoring and manual control of the behavior of the platform under test, and cannot On-site analysis data acquisition data report
A single test vector cannot obtain a more comprehensive error pattern in a round of tests. Personnel monitoring and manual participation interfere with the normal data flow process. The data cannot be analyzed on site and the direction of the next test cannot be obtained, making the following tests blind Bigger sex
[0004] Patent application number: 200710176529.9, "SPARC processor single event effect detection device and detection method" mainly uses dual-port RAM for data storage between the main control processor and the tested processor, and the method can only be tested once for a class of test vectors

Method used

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  • Spatial processor single particle experiment automatized test system and method
  • Spatial processor single particle experiment automatized test system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] Test vector: Find the number of single-event flips in the cache in a radiation environment (records include the number of one flip and multiple flip errors, and locate the address where the error occurred). This test module is used to monitor the flip of the cache module, which belongs to the function block test and SEU test.

[0042] Test object: instruction cache (16K*8), data cache (32K*8), parity bit (8K*8), instruction tag (4K*8), data tag (4K*8), parity bit (8K*8) 8)

[0043] The instruction cache is 16K, the data cache is 32K, the data tag is 4K, the instruction tag is 4K, and the parity bits are 8K and 8K respectively. Among them, the lower four bits of the tag are valid bits, the 5th to 15th bits are invalid, and the 16th bit is invalid. The bit to the 32nd bit is the data bit data of the tag.

[0044] Test environment: heavy particle environment

[0045] Test plan: Read the data of the cache of the processor under test through the main control processor and...

Embodiment 2

[0051] Regfile includes:

[0052] a) 136 internal registers (%g0--%g7, %o0--%o7, %l0--%l7)

[0053] b) Floating point registers

[0054] c) Floating-point general-purpose registers (%f0--%f31)

[0055] A total of 168 registers.

[0056] Error definition:

[0057] The Regfile test program monitors two kinds of errors

[0058] 1. The error is a modifiable error (that is, if a bit is wrong, edac will stop the flow, correct the error and write it back to the register),

[0059] 2. The error is an unmodified error (that is, if two digits are wrong, edac will generate a trap and enter the trap).

[0060] Test vector: Find the number of single-event flips in the Regfile under the radiation environment (including one flip and multiple flips, one flip counts one error, and multiple flips counts multiple errors).

[0061] Test environment: heavy particle environment

[0062] Test program:

[0063] (1) Program initialization sets all registers to initial values, and free register...

Embodiment 3

[0068] ALLTEST (IU_FPU) test

[0069] Test vector: Find the sensitivity of IU_FPU to single particles in the radiation environment. This test module monitors the flipping, function interruption, exception handling, timeout handling, WATCHDOG monitoring, etc. of the IU_FPU module.

[0070] Test object: including IU, FPU function modules

[0071] Test environment: heavy particle radiation environment

[0072] Test program:

[0073] (1) The program is initialized and the initial value of the register is set; according to the test scenario, the processor under test runs a set of integer operation test cases, such as factorization, fft transformation, matrix multiplication, etc.

[0074] (2) The tested processor transmits the operation data to the main control processor, and compares it with the data result stored by the main control processor.

[0075] (3) The main control processor should constantly compare the transmitted data, and record when the data is wrong. By counting ...

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Abstract

The invention provides a space processor single particle test automation testing system and a method, comprising a main control processor, a tested processor and a monitoring host machine; communication between the main control processor and the tested processor is carried out by a PCI bus; the main control process can be provided with a multi-scene testing module, a data analysis module and a self-adaptive negative feedback sensing module; a processing display module is arranged in the monitoring host machine; the system and the method of the invention can realize that each test aims at a plurality of testing vectors, can automatically adjust the testing vector according to the testing results, determine the most effective testing vector and has high reliability.

Description

technical field [0001] The invention relates to an automatic test system and method for single particle test. Background technique [0002] Single-particle tests at home and abroad usually use external monitoring or manual operation, that is, to observe in the test system with an external logic analyzer, oscilloscope and ammeter in the irradiation environment. The disadvantage of this method is that the observation window is small and cannot The observation results are recorded in real time, and the electrical performance requirements of the test site and the entire test system are relatively high. Using the traditional method and using an oscilloscope to observe, only the logic of the peripheral interface can be observed, and the ability to observe internal flips is limited, so it is impossible to effectively evaluate the number of single event flips. [0003] The existing test method for high-performance spatial processors, the host computer monitoring, and the test mode ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/00G01R31/00G01R31/317
Inventor 兰利东祝长民颜洁于立新范隆刘立全
Owner BEIJING MXTRONICS CORP
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