Method and system for reducing semiconductor chip particle contamination

A semiconductor and substrate technology, applied in the field of a method and system for reducing particle pollution of semiconductor substrates, can solve problems such as poor control effect and insignificant particle effect, and achieve the effects of reducing particle pollution and improving yield

Active Publication Date: 2009-08-19
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
View PDF0 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the method of controlling the airflow has a more obvious effect on the particles attached due to gravity, but the effect on the particles a

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for reducing semiconductor chip particle contamination
  • Method and system for reducing semiconductor chip particle contamination
  • Method and system for reducing semiconductor chip particle contamination

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0024] The embodiment of the present invention is to install an electrostatic field generating device at the substrate transfer station in the atmospheric end of the transmission system, and use the gravitational force of the electric field to eliminate the electrostatic adsorption particles on the semiconductor substrate that cannot be eliminated by the ion generator, and then achieve the particle size of the semiconductor substrate. purpose of control. The substrate transfer station may specifically be a substrate buffer device in the atmospheric end of the transmission system, or the substrate transfer station is located on the trajectory of the atmospheric manipulator. The technical solutions provided by the embodiments of the pres...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for reducing the particulate pollution of a semiconductor substrate, and a system thereof, pertaining to the field of semiconductor processing and manufacture. The method includes the steps that a semiconductor substrate is transferred to a substrate transfer station by an atmospheric mechanical arm; particles adsorbed on the surface of the semiconductor substrate are adsorbed and removed by an electrostatic field generating device; the adsorbed and removed particles are blown away by an air filtering and distributing device; and the semiconductor substrate is removed out of the substrate transfer station by the atmospheric mechanical arm. The system comprises the atmospheric mechanical arm, the substrate transfer station, the air filtering and distributing device, an ion generator and the electrostatic field generating device. In the invention, the electrostatic field generating device is added at the atmospheric end of a transfer system to control the adsorption mode of the particles of the semiconductor substrate so as to effectively reduce the particulate pollution during the transfer process of the semiconductor substrate and improve the rate of finished semiconductor substrate.

Description

technical field [0001] The invention relates to the field of semiconductor processing and manufacturing, in particular to a method and system for reducing particle pollution of semiconductor substrates. Background technique [0002] During the moving process of the semiconductor substrate, an atmospheric manipulator is usually used to move the semiconductor substrate from the atmospheric end of the transport system to the vacuum reaction chamber. In order to reduce the particle pollution of the semiconductor substrate during the moving process, the general method is to achieve the purpose of particle control by reducing the particle adhesion at the atmospheric end of the transmission system. Clean air is introduced into the atmospheric end of the transmission system at a certain wind speed, and an ion generator is installed at the atmospheric end of the transmission system. The principle of reducing the particle pollution of the semiconductor substrate by using the above tw...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01L21/00H01L21/30H01L21/67
Inventor 魏晓
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products