Method for growing AlInN monocrystal epitaxial film

An epitaxial film and single crystal technology, applied in the direction of single crystal growth, crystal growth, single crystal growth, etc., can solve the problems of low migration ability of surface adatoms, affecting applications, uneven components, etc., to achieve enhanced lateral migration ability, Effect of improving crystal quality and improving surface morphology

Inactive Publication Date: 2010-06-16
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the growth of AlN materials requires a relatively high temperature, and at the same time the V / III ratio cannot be large, and the ammonia gas flow rate is low, while the growth of InN materials is just the opposite, requiring a low growth temperature, a large V / III ratio, and a high ammonia gas flow rate, so The growth conditions of AlN and InN materials are exactly the two extremes of group III nitride materials, resulting in a relatively narrow growth window of AlInN; in addition, due to the differences in lattice parameters, bond lengths and thermal stability of AlN and InN Compared with InGaN, AlInN is more prone to phase separation, resulting in uneven composition
[0006] In addition, at a lower growth temperature, the migration ability of surface adatoms is relatively low, especially the adsorbed Al atoms, and it is difficult to grow high-quality AlInN single crystal epitaxial films.
Due to the existence of these problems, the crystal quality of the AlInN single crystal epitaxial film is not very high, which affects its further application.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for growing AlInN monocrystal epitaxial film
  • Method for growing AlInN monocrystal epitaxial film
  • Method for growing AlInN monocrystal epitaxial film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0028] The key of the invention is to provide a method for growing high-quality AlInN single crystal epitaxial film. Due to the relatively large differences in lattice parameters, bond lengths, and thermal stability between AlN and InN, AlInN is prone to phase separation, resulting in uneven composition. In addition, at a lower growth temperature, the migration ability of surface adatoms is relatively low, especially the adsorbed Al atoms, making it difficult to grow high-quality AlInN single crystal epitaxial films. In order to solve the problems of easy phase separation and low surface migration ability during the growth of AlInN, the present invention proposes to use nitrogen and an appropriate amount of hydrogen as th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
temperatureaaaaaaaaaa
pressureaaaaaaaaaa
Login to view more

Abstract

The invention discloses a method which adopts mixed gas of nitrogen and hydrogen as carrier gas to grow high-quality AlInN monocrystal epitaxial film. The method comprises the following steps: selecting a substrate; putting the substrate into a metallorganics chemical vapor deposition system; heating to the growth temperature; meanwhile, introducing TMIn, TMAl, NH3, N2 and a proper quantity of H2; and growing the AlInN monocrystal epitaxial film. The invention can improve AlInN crystallization quality, improves surface appearance and improves surface evenness.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a method for growing high-quality AlInN single crystal epitaxial films. Background technique [0002] The bandgap width of AlN is 6.2eV, and that of InN is 0.7eV, so the bandgap width of AlInN has a large adjustable range. If it is used as the active layer of a nitride semiconductor optoelectronic device, its light-emitting wavelength can cover the range from infrared to ultraviolet; in addition, the lattice constant of AlInN also has a large adjustable range, so that it can be compared with other epitaxial layers. Good lattice matching, such as AlInN / GaN, AlInN / InGaN, and AlInN / AlGaN, can especially make a heterostructure that matches the GaN lattice, which can reduce defects or cracks caused by lattice mismatch. [0003] Recently, AlInN / GaN and AlInN / AlGaN heterostructures have been successfully applied to Bragg reflectors (DBRs). Before the mid-1990s, few people studi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C30B25/02C30B29/38
Inventor 卢国军朱建军赵德刚刘宗顺张书明杨辉
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products