Etchant composition for and etching method of materials containing copper
A technology of etchant and composition, which is applied in the etchant composition for copper-containing materials and the field of etching of copper-containing materials, and can solve the problems of inability to obtain etching performance, poor shape of circuit patterns, etc.
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Embodiment 1 and comparative example 1
[0068] The nonionic surfactant shown in Table 1 and Table 2, ferric chloride (iron ion), hydrogen chloride, copper (copper ion) and water were mixed according to the composition in Table 3 to obtain an etchant composition. In addition, the remainder of the content in Table 3 is water.
[0069] table 3
[0070]
Embodiment 2 and comparative example 2
[0072] The etchant obtained in the above-mentioned Examples and Comparative Examples was used for a test substrate in which a dry film resist patterned with a line width of 100 μm and a predetermined line spacing (etching space) was formed on a resin substrate having a copper foil with a thickness of 20 μm. composition, spray etching the test substrate under specified conditions. Thereafter, the dry film resist was removed by immersing in a 5% by mass sodium hydroxide aqueous solution (50° C.) for 1 minute. The shape of the obtained copper circuit was evaluated as follows.
[0073] (1) Wiring upper width (top width)
[0074] The cross section (observation section) was measured with an optical microscope. The unit is μm.
[0075] (2) Wiring lower part width (bottom width)
[0076] The cross section (observation section) was measured with an optical microscope. The unit is μm.
[0077] (3) Difference between bottom width and top width
[0078] Calculate it using the follo...
Embodiment 3 and comparative example 3
[0088] The nonionic surfactants shown in Table 1 and Table 2, ferric chloride, hydrogen chloride, copper, and water were mixed according to the composition in Table 6 to obtain an etchant composition. In addition, the remainder of the content in Table 6 is water.
[0089] Table 6
[0090]
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