High-compatibility multi-functional test Duvel for separate Dewar hot load test

A technology for multi-functional testing and load testing, which is applied in measurement devices, optical radiation measurement, radiation pyrometry, etc., to achieve the effects of simple structure and implementation method, high test accuracy and low cost

Active Publication Date: 2012-05-02
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a highly compatible and multifunctional testing Dewar for thermal load testing of separate Dewars to solve the thermal load testing of large thermal load Dewar components and the testing of the coupling effect of Dewars and refrigerators

Method used

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  • High-compatibility multi-functional test Duvel for separate Dewar hot load test
  • High-compatibility multi-functional test Duvel for separate Dewar hot load test

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Embodiment Construction

[0069] The specific embodiment of the present invention is described in further detail below in conjunction with accompanying drawing:

[0070] Embodiment is the thermal load test of a certain large thermal load (according to estimation thermal load value is greater than 1.5 watts) infrared detector focal plane Dewar assembly, as attached figure 1 As shown, its main implementation method is as follows:

[0071] 1. The preparation method and assembly sequence of each component of a highly compatible and multi-functional testing Dewar for thermal load testing of the split-type Dewar of the present invention are as follows:

[0072] a) The cavity cap 1 is made of stainless steel 304L, and the exhaust pipe 18 is an oxygen-free copper tube with an outer diameter of 6 mm and an inner diameter of 4 mm and a length of 60 mm. The exhaust pipe 18 is brazed to the opening 101 of the exhaust pipe of the cavity cap 1 using a brazing furnace. Use a leak detector to inspect the weld, and th...

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Abstract

The invention discloses a high-compatibility multi-functional test Duvel for separate Duvel hot load test, which is suitable for hot load test of a separate high-hot-load engineering Duvel and test of the refrigerator coupling effect. The high-compatibility multi-functional test Duvel for the separate Duvel hot load test comprises a cavity cap, a lead disc, a sealing snap ring, a flange seat and the like. A special structure is introduced into the high-compatibility multi-functional test Duvel, and accurate test the static hot load of the separate engineering Duvel is realized through assembly replacing and thermal equivalent methods. A device and an implementing method disclosed by the invention are simple, and have high measuring accuracy, high universality and low cost. The Duvel is suitable for testing the refrigerating amounts of an engineering refrigerator at different refrigerating temperatures and testing the temperature gradients of an elastic cold chain on a cold finger of the engineering refrigerator or carbon paper or other coupling media at different refrigerating temperatures and different transmission cold amounts.

Description

technical field [0001] The present invention relates to the manufacturing technology of infrared detector Dewar components, in particular to a highly compatible and multi-functional test Dewar for thermal load testing of separate Dewars, which is suitable for thermal load testing of separate large thermal load engineering Dewars A test of the coupling effect with the refrigerator. Background technique [0002] Infrared detector Dewar components are widely used in aerospace infrared field. With the expansion of wavelength to long wavelength and the improvement of detection sensitivity, infrared focal detectors must work at deep and low temperatures. Due to the advantages of mechanical refrigeration, such as compact structure, small size, light weight, large cooling capacity, short cooling time, and large controllable range of cooling temperature, most of these detectors currently use mechanical cooling in space applications. This also makes it mostly use Dewar packaging to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/02
Inventor 夏王王小坤孙闻
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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