Method for measuring fineness of raw silks in real time and device of method

A technology for real-time measurement of raw silk, applied in non-contact measurement of raw silk fineness, measurement of raw silk or fiber fineness, and dynamic fields, which can solve the problem of large dispersion of transparency and refractive index, inability to detect raw silk knots, and inability to accurately reflect raw silk, etc. problem, achieve the effect of suppressing the interference of ambient stray light, realizing dynamic real-time measurement, and avoiding errors

Inactive Publication Date: 2012-06-27
SUZHOU UNIV +1
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Problems solved by technology

The static fineness measurement method is only suitable for use in the laboratory and the process room of the factory. The average fineness of a batch (secondary) raw silk (fiber) is measured by the static method, and the knots of the raw silk cannot be detected, and the raw silk after the test can only be Scrapped
[0004] At present, the methods of dynamic fineness measurement mainly include: 1. Capacitive type, which uses the diameter of raw silk (fiber) to change the distance between the electrodes of the capacitor, so that the capacitance changes ΔC and the dielectric constant ε r2 It is related to the texture of raw silk (fiber) and the air humidity in the measurement environment; 2. Photoelectric type, which uses the principle of measuring the intensity of light reflection or refraction to detect the fineness of raw silk. (Fiber) transparency and refractive index dispersion are large, so that the detection data can not accurately reflect the raw silk (fiber) silk diameter; 3. Orthogonal two-way CCD photoelectric detection type, document "CCD raw silk fineness dynamic measurement system design" ([J ]Silk, 2002 (1): 44-46), disclose a kind of method that adopts linear array CCD to measure raw silk fineness in real time as photoelectric conversion device, it is to use linear array CCD as measuring element, measuring light is projected to CCD In the above, the dark spot formed by the light shielding of the raw silk to be tested is used. Since the size of the dark spot measured by this method is a bright background imaging measurement, the measurement diameter of the raw silk is usually about 60um, and the size of the linear array CCD photosensitive element is 14um. The measurement accuracy is limited. Although the microscope is generally modified to form a microscopic imaging system, the raw silk (fiber) to be tested is magnified dozens of times. However, during dynamic measurement, the raw silk (fiber) shakes slightly, and the imaging will also follow. changes, resulting in measurement errors
In addition, bright background imaging can easily saturate the CCD
Therefore, this method has many shortcomings in the measurement under dynamic conditions.

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  • Method for measuring fineness of raw silks in real time and device of method

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Embodiment 1

[0021] See attached figure 1 , which is a functional module diagram of a real-time measurement device for raw silk fineness provided in this embodiment; the measurement device includes an optical measurement part composed of a laser light source module, a beam shaping module, a macro imaging module and a CCD receiving module, and an image processing module And the measured value output module constitutes the data processing and output part. The semiconductor laser LD is used as the light source for the measurement of this system. Since the LD light source has certain divergence and elliptical spots, it will affect the measurement effect. Therefore, this embodiment uses a cylindrical optical lens. When the laser beam passing through the thin diaphragm passes through The optical lens produces a certain angle of divergence, and the larger the diameter of the cylinder, the smaller the divergence angle. A convex lens is placed in the diverging light path so that the focal point of...

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Abstract

The invention discloses a method for measuring fineness of raw silks in real time and a device of the method. The device comprises a parallel optical field, a microspur imaging system, a photoelectric sensor and an image processing system. During measurement, standard sample silks and raw silks to be measured are placed in the same parallel optical field, after reflecting light of the standard sample silks and the raw silks is in Fourier transform, the photoelectric sensor obtains a frame of image signals of the standard sample silks and the raw silks to be measured, and measurement results of the fineness of the raw silks to be measured are obtained via data processing. As the reflecting light of the raw silks is acquired during measurement, saturation of photosensitive elements of a CCD (charge coupled device) is avoided effectively, and distortion due to microscopy imaging is avoided by the aid of microspur imaging. Simultaneously, as the raw silks to be measured and the standard sample silks are located in the same optical field, measurement precision cannot be affected by environment factors, and accuracy and stability of measured values are effectively improved. The method and the device are applicable to measuring fineness of raw silks, wool, textile fibers and the like, and the device is an effective tool for realizing non-contact real-time dynamic fiber fineness detection.

Description

technical field [0001] The invention relates to a method for measuring the fineness of raw silk or fiber, in particular to a dynamic and non-contact method for measuring the fineness of raw silk (fiber), which belongs to the technical field of precision measuring instruments. Background technique [0002] Fineness is the dimension index that describes the thickness of fibers and threads. The fineness of raw silk is closely related to the processing technology of raw silk and the quality of silk fabrics. It determines the variety, style, use and physical and mechanical properties of silk fabrics. At the same time, since the fineness of raw silk determines the quality of silk-centred fabrics to a certain extent, the average fineness and fineness distribution of raw silk become one of the important parameters for evaluating the quality of raw silk. [0003] The methods of raw silk fineness measurement can be divided into static and dynamic. Static fineness measurement methods ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/08
Inventor 周望刘凤娇李丹李烨费万春裔宏根
Owner SUZHOU UNIV
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