Doping unit, doping wafer, doping method, battery and manufacturing method
A manufacturing method and wafer technology, applied in the field of solar energy doping units, can solve the problem of high cost of photolithography process
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Embodiment 1
[0094] refer to Figure 1a A P-type heavily doped region 21 is formed in the first region for contacting the anode electrode on the back surface of the N-type substrate 1 . Specifically, place the first mask 10 on the back of the N-type substrate 1, accelerate boron ions to 500eV, and implant them from the area of the N-type substrate 1 not covered by the first mask 10 on the back of the N-type substrate 1 by means of ion implantation. to the back of the N-type substrate 1 to form a P-type heavily doped region 21 with a sheet resistance of 10Ω / □, wherein the region not covered by the first mask 10 is the first region for contacting the anode electrode. The arrows in the figure indicate the direction of ion implantation, which is only for those skilled in the art to understand the present invention, and should not be construed as a limitation of the present invention.
[0095] refer to Figure 2a An N-type heavily doped region 31 is formed in the third region on the back of...
Embodiment 2
[0099] The principle of embodiment 2 is the same as embodiment 1, and its main process steps are also the same, and the difference only lies in the selection of the following processes and parameters:
[0100] refer to Figure 1a , accelerate boron ions to 50keV and implant them into the back of the N-type substrate 1 from the region of the back of the N-type substrate 1 not covered by the first mask 10 by means of ion implantation to form a P with a sheet resistance of 50Ω / □ Type heavily doped region 21.
[0101] refer to Figure 2a Accelerate phosphorus ions to 50keV and implant them into the back of the N-type substrate 1 from the region of the back of the N-type substrate 1 not covered by the second mask 11 by means of ion implantation to form an N with a sheet resistance of 50Ω / □ Type heavily doped region 31. In this embodiment, the minimum distance between the P-type heavily doped region 21 and the N-type heavily doped region 31 is 70 μm.
[0102] refer to Figure 3...
Embodiment 3
[0105] The principle of embodiment 3 is the same as embodiment 1, and its main process steps are also the same, and the difference only lies in the selection of the following processes and parameters:
[0106] refer to Figure 1a , accelerating boron ions to 30keV and implanting boron ions into the back of the N-type substrate 1 from the region of the back of the N-type substrate 1 not covered by the first mask 10 by means of ion implantation to form a P with a sheet resistance of 30Ω / □ Type heavily doped region 21.
[0107] refer to Figure 2a , accelerate phosphorus ions to 30keV and implant them into the back of the N-type substrate 1 from the region of the back of the N-type substrate 1 not covered by the second mask 11 by means of ion implantation to form an N with a sheet resistance of 40Ω / □ Type heavily doped region 31. In this embodiment, the minimum distance between the P-type heavily doped region 21 and the N-type heavily doped region 31 is 50 μm.
[0108] refer ...
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