Thermal ionization time-of-flight mass spectrometer and thermal ionization time-of-fight mass spectrometric analysis method

A time-of-flight mass spectrometry and time-of-flight technology, applied in the field of mass spectrometry, can solve the problems of long ionization time, high requirements for sample separation purity, errors, etc., and achieve accurate measurement results

Inactive Publication Date: 2013-08-28
BEIJING RES INST OF URANIUM GEOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Its disadvantages are: 1) The ionization time is long, which is similar in magnitude to the time-of-flight of general ions, and it is easy to cause large errors; 2) The ionization of electrons and its sampling method determine that this ionization source is difficult to analyze macromolecular substances
However, TIMS technology has high operating costs, slow sample analysis speed, and high requirements for the separation purity of samples, and chemical separation is required before sample determination.

Method used

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  • Thermal ionization time-of-flight mass spectrometer and thermal ionization time-of-fight mass spectrometric analysis method
  • Thermal ionization time-of-flight mass spectrometer and thermal ionization time-of-fight mass spectrometric analysis method
  • Thermal ionization time-of-flight mass spectrometer and thermal ionization time-of-fight mass spectrometric analysis method

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Experimental program
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Effect test

Embodiment 1

[0054] The TI-TOF-MS optimized electrical parameter combination of Embodiment 1 is: the current of the filament in the ion source is 2.7A, the positive voltage loaded on the filament is 25.5V, and the voltages of the three diaphragms of the first diaphragm lens group 61 are respectively 0V, 0V, 3V, the voltages of the three diaphragms of the second diaphragm lens group 62 are 12.8V, 18V, 0V respectively, and the voltages of the three diaphragms of the third diaphragm lens group 63 are respectively 4.6V, 0V, 0V, The four voltages of up, down, left and right of DC quadrupole DCQ are 10.4V, 11.2V, 11.5V, 11.3V respectively; the voltage of lens 8 is -14.0V and -14.5V, vertical time-of-flight mass analyzer The electrical parameters of 3 are 431.6V for positive pulse, -187.2V for negative pulse, 620.7V for B-Plate, -329.5V for Grid, and -2665V for ACCE.

[0055] Measurement results: The measured abundance of 981Pb standard solution is consistent with the reference value, and the rel...

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Abstract

The invention provides a thermal ionization time-of-flight mass spectrometer and a thermal ionization time-of-fight mass spectrometric analysis method, and belongs to the technical field of mass spectrometric analysis. The thermal ionization time-of-flight mass spectrometer is mainly composed of an ion source, an ion transmission system and a vertical reflection type time-of-flight mass analyzer. The thermal ionization time-of-flight mass spectrometer is used, an analysis sample is arranged in the ion source and fixed on a filament band on a sample frame, currents of the filament band are increased to enable the sample to be ionized, ion beams are transmitted and modulated by an ion transmission lens assembly in the ion transmission system and reach the vertical reflection type time-of-flight mass analyzer, ions with different masses reach a detector after different flight time, and the qualitative and quantitive analysis or the isotope analysis of the sample is achieved. According to the thermal ionization time-of-flight mass spectrometer and the thermal ionization time-of-fight mass spectrometric analysis method, isotope abundance can be quickly and accurately measured, impurity elements are monitored, and an innovative mass spectrometric analysis technology is achieved.

Description

technical field [0001] The invention belongs to the field of mass spectrometry, in particular to a mass spectrometry instrument and a mass spectrometry method using the instrument. Background technique [0002] Mass spectrometry is an analytical method for compositional analysis by measuring the mass-to-charge ratio of the ions of the substance to be measured in the sample. The sample to be analyzed must first be ionized, and then use the difference in the motion behavior of different ions in the electric field or magnetic field to separate the ions according to the mass-to-charge ratio (m / z) to obtain a mass spectrum. Through the mass spectrum and related information of the substance to be measured in the sample , the qualitative and quantitative results of the substance in the sample can be obtained. At present, mass spectrometry has been widely used in various fields such as chemistry, chemical industry, materials, environment, geology, energy, medicine, criminal investi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/16H01J49/40G01N27/62G01N27/626
Inventor 郭冬发李金英董晨刘桂方范增伟谭靖谢胜凯
Owner BEIJING RES INST OF URANIUM GEOLOGY
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