Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Crystalline silicon solar cell resisting to PID effect and manufacturing method thereof

A solar cell, crystalline silicon technology, applied in circuits, electrical components, semiconductor devices, etc., can solve the problems of poor adhesion between silicon nitride and silicon materials, PID attenuation, and component output power drop, etc., to enhance the passivation effect, Improves performance and prevents contamination

Inactive Publication Date: 2013-11-27
CECEP SOLAR ENERGY TECH (ZHENJIANG) CO LTD
View PDF4 Cites 21 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The silicon nitride film of crystalline silicon solar cells produced by this process cannot meet the insulation requirements, the PID attenuation phenomenon is very serious, and the output power of the module drops significantly.
[0004] The PN junction of ordinary crystalline silicon solar cells is only protected by a silicon nitride film, and the adhesion between silicon nitride and silicon materials is poor, and Si-SiN 4 The interface stress of the structure is large and the interface state density is high, which will cause instability and affect the passivation effect of the surface

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Crystalline silicon solar cell resisting to PID effect and manufacturing method thereof
  • Crystalline silicon solar cell resisting to PID effect and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0018] A kind of anti-PID effect crystalline silicon solar cell of the present invention, its structure diagram is as follows figure 1 As shown, it includes a silicon substrate and a passivation film arranged on the silicon substrate, and the passivation film includes a dense layer of SiO deposited on the front surface of the silicon substrate in sequence. 2 , loose layer SiO 2 , dense layer Si 3 N 4 and loose layer Si 3 N 4 .

[0019] The dense layer of SiO 2 Thickness is 5nm, the loose layer SiO 2 The thickness is 10nm; the dense layer Si 3 N 4 The refractive index of 2.3, thickness is 10nm; The loose layer Si 3 N 4 The refractive index is 2.08 and the thickness is 60nm.

[0020] The preparation method of the anti-PID effect crystalline silicon solar cell: including texturing-diffusion-etching-oxidation-PECVD-screen printing-sintering test steps, oxidation and PECVD steps are:

[0021] (1) On the etched silicon wafer substrate, a dense layer of SiO is formed by h...

Embodiment 2

[0024] The dense layer SiO in embodiment 1 2 Thickness processing is 7nm, loose layer SiO 2 Thickness processing is 13nm, dense layer Si 3 N 4 Thickness processing is 13nm, dense layer Si 3 N 4 Refractive index 2.33, loose layer Si 3 N 4 Thickness processing is 63nm, loose layer Si 3 N 4 The refractive index is 2.09, and other main process parameters remain unchanged, so that a crystalline silicon solar cell resistant to PID effect is produced.

Embodiment 3

[0026] The dense layer SiO in embodiment 1 2 Thickness processing is 8nm, loose layer SiO 2 Thickness processing is 15nm, dense layer Si 3 N 4 Thickness processing is 15nm, dense layer Si 3 N 4 Refractive index 2.35, loose layer Si 3 N 4 Thickness processing is 65nm, loose layer Si 3 N 4 The refractive index is 2.10, and other main process parameters remain unchanged, so that a crystalline silicon solar cell resistant to PID effect is produced.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a crystalline silicon solar cell resisting to a PID effect. The crystalline silicon solar cell comprises a silicon substrate and a passive film arranged on the silicon substrate. The passive film comprises a compact layer SiO2, a loose layer SiO2, a compact layer Si3N4 and a loose layer Si3N4 all of which sequentially deposit on the front surface of the silicon substrate in a laminated mode. In addition, the invention relates to a manufacturing method of the crystalline silicon solar cell. The manufacturing method comprises the steps of texture making, diffusion, etching, oxidation, PECVD, silk-screen printing and sintering test. Double SiO2 / Si3N4 films composed of an SiO2 passive film growing under the low temperature and an Si3N4 film are adopted so as to obviously improve the performance of the solar cell and enhance the passivation effect of the surface of the solar cell, wherein the Si3N4 film is formed in the PECVD mode and has the hydrogen passivation function and good antireflection effect.

Description

technical field [0001] The invention relates to a crystalline silicon solar cell with anti-PID effect and a preparation method thereof. Background technique [0002] PID-Potential-induced degradation (Potential-induced degradation) was first discovered by Sunpower in 2005. The long-term high voltage of the component causes leakage current between the glass and the packaging material, and a large amount of charge accumulates on the surface of the cell, so that the cell The passivation effect of the front surface is weakened, which leads to the decrease of Uoc and FF of the cell, and the power attenuation of the cell and module; domestic power stations have also discovered the PID phenomenon one after another, and the output power of the module gradually decreases under the PID effect until there is no output power; conventional crystalline silicon solar cell technology The steps are: texturing-diffusion-etching-PECVD-screen printing-sintering test; [0003] The silicon nitri...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0216H01L31/18
CPCY02P70/50
Inventor 魏文文勾宪芳王鹏姜利凯
Owner CECEP SOLAR ENERGY TECH (ZHENJIANG) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products