Method for measuring key geometrical characteristics of nanometer particles
A technology of key geometric features and nanoparticles, applied in the field of optical measurement, it can solve the problems of slow measurement speed, high cost and low efficiency, and achieve the effect of improving stability and accuracy
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[0032] The method for measuring key geometric characteristic quantities of metal nanoparticles provided by the present invention will be described in detail below with reference to the accompanying drawings. For the convenience of description, the present invention first introduces a spectrum measurement system for measuring key geometric characteristic quantities of metal nanoparticles.
[0033] See figure 1 , The first embodiment of the present invention provides a spectrum measurement system 100. The spectrum measurement system 100 includes a light source module 20, a chopper 6, a reference sample module 30, a reflection module 40, a sample cell 3, and a photoelectric Detection and processing unit 5. The light emitted by the light source module 20 is split by the chopper 6 to form two light beams. One of the light beams enters the photodetection and processing unit 5 after passing through the reference sample module 30; the other light beam enters the sample cell 3 after bein...
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