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Method for measuring key geometrical characteristics of nanometer particles

A technology of key geometric features and nanoparticles, applied in the field of optical measurement, it can solve the problems of slow measurement speed, high cost and low efficiency, and achieve the effect of improving stability and accuracy

Active Publication Date: 2014-01-08
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Microscopic imaging can obtain rich geometric information of a single nanoparticle, but cannot obtain the overall information of many particles (such as geometric scale distribution, etc.), and the measurement speed is slow, the efficiency is low, the cost is high, the equipment investment is large, and professional operation is required etc. It is not convenient for measurement outside the laboratory and real-time measurement
Dynamic light scattering method and small-angle X-ray scattering method have fast measurement speed, high efficiency, low cost, simple operation, convenient operation outside the laboratory and real-time measurement, and can obtain a large amount of statistical measurement data, but the disadvantage is that they can only measure many nanoparticles The average information of individual particles cannot detect the size and shape information of individual particles, and the reconstruction of particle morphology requires high requirements for the corresponding theoretical model and numerical algorithm of the inverse problem.

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  • Method for measuring key geometrical characteristics of nanometer particles

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Embodiment Construction

[0032] The method for measuring key geometric characteristic quantities of metal nanoparticles provided by the present invention will be described in detail below with reference to the accompanying drawings. For the convenience of description, the present invention first introduces a spectrum measurement system for measuring key geometric characteristic quantities of metal nanoparticles.

[0033] See figure 1 , The first embodiment of the present invention provides a spectrum measurement system 100. The spectrum measurement system 100 includes a light source module 20, a chopper 6, a reference sample module 30, a reflection module 40, a sample cell 3, and a photoelectric Detection and processing unit 5. The light emitted by the light source module 20 is split by the chopper 6 to form two light beams. One of the light beams enters the photodetection and processing unit 5 after passing through the reference sample module 30; the other light beam enters the sample cell 3 after bein...

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Abstract

A provided method for measuring key geometrical characteristics of nanometer particles comprises the following steps: loading the nanometer particles on a sample pool to obtain an extinction spectrum of the nanometer particles; arranging a mixed solution containing the nanometer particles in a referential sample pool and the sample pool for measuring to obtain a scattered spectrum of the nanometer particles; changing the concentration and the optical path length of metal nanometer particles, repeating the above steps, exporting measured data according with a linear response zone; pre-estimating the kinds of the key geometrical characteristics contained by the nanometer particles and the geometrical scale distribution scope; establishing databases of the relationship about the key geometrical characteristics with the extinction section coefficient and with the scattering cross-section coefficient; respectively converting the databases of the relationship about the key geometrical characteristics with the extinction cross-section coefficient and with the scattering section coefficient into matrixes, and converting the inverse problem into a linear equation group; and solving according to the databases of the extinction spectrum, the scattered spectrum and the extinction cross-section coefficient and the database of the scattering cross-section coefficient, to obtain the key geometrical characteristics of the nanometer particles.

Description

Technical field [0001] The invention relates to the field of optical measurement, in particular a method for measuring key geometric characteristic quantities of nanoparticles, especially metal nanoparticles, by using a scattering spectrum measurement method. Background technique [0002] Nanoparticles refer to particles with a three-dimensional geometric dimension between 1nm and 100nm. Nanoparticles, especially metal nanoparticles, are due to their unique physical, chemical, and optical properties, especially the unique localized surface plasmon resonance (LSPR) effect, This makes metal nanoparticles have a wide range of important applications in the fields of catalysis, biochemical sensing, biomolecular labeling, medical imaging and auxiliary diagnosis, drug delivery and release, plasma photonics, and surface enhanced Raman spectroscopy. The key geometric characteristics of a large number of nanoparticles mainly include shape characteristics such as the aspect ratio parameter ...

Claims

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Application Information

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IPC IPC(8): G01N15/02
Inventor 徐宁汉白本锋谭峭峰金国藩
Owner TSINGHUA UNIV
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