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Front metal process for compression joint IGBT

A metal technology, crimping technology, applied in the direction of electrical components, electrical solid devices, semiconductor/solid device manufacturing, etc.

Active Publication Date: 2014-12-24
上海积塔半导体有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There is only one layer of metal on the front side of the IGBT, and a layer of metal needs to form different thicknesses in different wiring areas, which cannot be achieved by conventional metal etching processes
[0005] In addition, metals with a thickness of more than ten microns have many insurmountable difficulties in photolithography and etching processes

Method used

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  • Front metal process for compression joint IGBT
  • Front metal process for compression joint IGBT
  • Front metal process for compression joint IGBT

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Embodiment Construction

[0030] The present invention will be further described below in conjunction with specific embodiment and accompanying drawing, set forth more details in the following description so as to fully understand the present invention, but the present invention can be implemented in many other modes different from this description obviously, Those skilled in the art can make similar promotions and deductions based on actual application situations without violating the connotation of the present invention, so the content of this specific embodiment should not limit the protection scope of the present invention.

[0031] In order to illustrate the technical solution of the present invention more clearly, here is a preliminary introduction to the structure of the front metal layer of the pressure-contact IGBT. figure 1 A schematic diagram of the plane position of the emitter pad and the gate pad of the pressure-connected IGBT realized by the front metal process of an embodiment of the pre...

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Abstract

The invention provides a front metal process for a compression joint IGBT. The process comprises the steps that a first front metal layer is deposited on an interlayer dielectric layer; the first front metal layer is subjected to wet etching, so that a first groove which is wide on the upper portion and narrow on the lower portion is formed in the interlayer dielectric layer; a barrier layer is deposited on all surfaces of the current structure, and a barrier layer window in a region where thick metal needs to be formed is opened; the surface, exposed after the window is opened, of the first front metal layer is subjected to pretreatment before deposition, so that an oxide layer is removed; a second front metal layer is deposited on all the surfaces of the current structure; the second front metal layer is subjected to wet etching, so that a second groove is formed in the second front metal layer, wherein the side walls of the second groove incline, and the second groove guides the first groove and is wide on the upper portion and narrow on the lower portion; the second groove is subjected to dry etching, the second front metal layer is etched through, and metal in the first groove is cleared up; a protection slope is formed on the barrier layer wrapped at the upper edge of the first groove, wherein the bottom of the protection slope has a certain width. By means of the front metal process, thick front metal and thin front metal in different wiring regions are obtained.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing technology, in particular, the invention relates to a front metal process of a pressure-connected IGBT. Background technique [0002] Insulated gate bipolar transistor (IGBT) is a composite device of MOSFET and BJT. IGBT combines the advantages of both MOSFET and Bipolar, and has the advantages of high voltage and high current. It is currently widely used in power transmission, high-speed Train traction, industrial drive, clean energy and many other fields. [0003] The traditional IGBT uses wire bonding / welding to form modules, while the crimping IGBT module is directly pressure-connected, which eliminates the points of failure and improves reliability; the internal layout has low inductance and the inductance distribution between chips is consistent; double-sided Heat dissipation reduces thermal resistance; safe operation at high temperatures. Another notable feature is the...

Claims

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Application Information

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IPC IPC(8): H01L21/331H01L21/28
CPCH01L21/76895H01L2221/1068
Inventor 刘建华李雪萍
Owner 上海积塔半导体有限公司
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