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Photoelectronic imaging device for researching anion system

A photoelectron imaging and negative ion technology, which is applied in the measurement of X-ray energy spectrum distribution, etc., can solve the problem that the kinetic information of the negative ion system cannot be directly detected.

Active Publication Date: 2015-05-06
ZHANGJIAGANG IND TECH RES INST CO LTD DALIAN INST OF CHEM PHYSICS CHINESE ACADEMY OF SCI +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, despite the many advantages mentioned above, photoelectron spectroscopy still has great limitations for negative ion systems with complex structures, especially in the acquisition of structural information.
At the same time, photoelectron spectroscopy still cannot directly detect the kinetic information of negative ion systems.

Method used

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  • Photoelectronic imaging device for researching anion system
  • Photoelectronic imaging device for researching anion system
  • Photoelectronic imaging device for researching anion system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0053] Mass Spectrometry of Copper Negative Ion Composite Clusters Generated by Nanosecond Laser Sputtering

[0054] This embodiment is intended to illustrate the performance of the ion source used to generate a specific negative ion system in this invention. In this embodiment, the pulse width is about 10 nanoseconds, the laser frequency is 20 Hz, the energy is 0.9 W to 1.9 W, and the wavelength is 532 nm. Focus on the copper target through a lens with a focal length of 35 cm, and form plasma on the surface of the copper target. The generated plasma is cooled by the He carrier gas carrying methanol solvent molecules sprayed through the pulse valve. During the cooling process, copper negative ions and complex cluster negative ions of copper and methanol solvent molecules will be generated. These negative ions are accelerated and collimated by the ion beam acceleration and collimation unit 5. Specifically, the first electrode sheet is applied here- Pulse high voltage of 1400 ...

Embodiment 2

[0056] Copper anion single-photon desorption imaging

[0057] The purpose of this embodiment is to illustrate the imaging performance of the electrons desorbed by the subsequent femtosecond laser system by the selected mass of copper negative ions generated by the nanosecond laser sputtering negative ion source 3 . The implementation conditions adopted in Example 1 are adopted in the present embodiment to produce negative copper ions. The copper negative ions enter the photoelectron velocity focusing electrode unit 7 through the isolation cone, and the negative ion beam interacts with the femtosecond laser between the first and second electrodes of the photoelectron velocity focusing electrode unit 7 . Specifically in this embodiment, the central wavelength of the femtosecond laser fundamental frequency light generated by the femtosecond laser system 1 is 810 nanometers, the frequency is 20 Hz, the pulse width is 70 femtoseconds, and the power is 160 milliwatts. The femtoseco...

Embodiment 3

[0059] Copper anion two-photon desorption imaging

[0060] This example is intended to illustrate that the device can realize infrared desorption of negative ion systems with relatively low desorption energy, as well as multi-photon desorption. The test object that this example adopts is the copper negative ion that produces through embodiment 1. The copper negative ions enter the photoelectron velocity focusing electrode unit 7 through the isolation cone, and the negative ion beam interacts with the femtosecond laser between the first and second electrodes of the photoelectron velocity focusing electrode unit 7 . Specifically in this embodiment, the central wavelength of the femtosecond laser fundamental frequency light generated by the femtosecond laser system 1 is 810 nanometers, the frequency is 20 Hz, the pulse width is 70 femtoseconds, and the power is 160 milliwatts. The femtosecond laser fundamental frequency light passes through the optical path conversion unit 2 and...

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Abstract

The invention relates to a photoelectronic imaging device for researching anion system. The nanosecond laser sputtering anion source unit is used for generating stable anion beam source with high strength and has interaction with the femtosecond laser in the photoelectronic speed focusing lens unit region, an electronic imaging detector unit is used for clearly measuring the energy spectrum and angle distribution information of the electron with excited state of the anion system. And the dynamic characteristic of the information can be obtained by combining with the time resolution technology. The ultrafast time resolution photoelectronic imaging technology is used for clearly obtaining the anion system with required single component and obtaining the microcosmic information as bond energy of the substance, and the ultrafast dynamics information with excited state can be observed at real time.

Description

technical field [0001] The invention relates to the field of microchemical reaction kinetics, in particular to an optoelectronic imaging device for studying the structure of negative ions and their excited states, which can complete the intuitive imaging detection of the desorption energy of the negative ion system and the kinetic information of the excited states of the negative ions . Background technique [0002] The purpose of microscopic chemical reaction kinetics is to explore how chemical reactions proceed at the atomic and molecular levels. As an important branch of microscopic chemical reaction kinetics, photochemical reactions can help people understand some physical and chemical properties of primitives in more detail, thereby It provides important help to realize the understanding of chemical reactions at the atomic and molecular level. As a ubiquitous form of matter in nature, the negative ion system is widely involved in many physical chemistry and related lif...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/36
Inventor 王利刘本康王艳秋
Owner ZHANGJIAGANG IND TECH RES INST CO LTD DALIAN INST OF CHEM PHYSICS CHINESE ACADEMY OF SCI
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