A reverse conduction type igbt device and its manufacturing method
A manufacturing method and device technology, which are used in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., to achieve the effect of improving performance and increasing stability
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Embodiment 1
[0050]This embodiment provides a method for fabricating a reverse conduction IGBT device, please refer to image 3 The schematic flow chart of the doping method for the semiconductor structure of this embodiment shown includes:
[0051] Step S201: Based on a semiconductor structure including an IGBT cell region and a fast recovery diode cell region separated from each other, a copper electrode layer is formed on the upper surface of the IGBT cell region;
[0052] Step S202: forming an injection barrier layer on the semiconductor structure on the region other than the IGBT cell region and the FRD cell region;
[0053] Step S203: Using the copper electrode layer as a barrier layer, performing ion implantation on the semiconductor structure, the ion implantation is used for minority carrier lifetime control of the FRD cellular region;
[0054] Step S204: removing the injection barrier layer;
[0055] Step S205: forming a metal electrode layer on the upper surface of the FRD cel...
Embodiment 2
[0084] This embodiment provides a reverse-conducting IGBT device fabricated by the method of the above embodiment, and the device includes a semiconductor structure, and the semiconductor structure includes an IGBT cell region and an FRD cell region surrounding the IGBT cell region. Among them, such as Figure 5 As shown, the upper surface of the IGBT cell region has a copper electrode layer 301, and the thickness of the copper metal layer is 5 μm˜30 μm. The upper surface of the FRD cell region has a metal electrode layer 302, and the metal electrode layer is electrically connected to the copper electrode layer on the upper surface of the IGBT cell region.
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