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A method and device for testing the resistance in the thickness direction of a composite thin film material

A technology of composite film and material thickness, which is applied in measurement devices, measurement of resistance/reactance/impedance, measurement of electrical variables, etc., can solve problems such as inability to eliminate point pressure, large error margin of measurement results, and distortion of material resistance judgment, to avoid Effects of concentrated pressure and mechanical piercing

Active Publication Date: 2018-06-26
宇东箔材科技南通有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Although the four-probe square resistance test method reduces the piercing effect by using a circular probe and the elastic device controls the probe pressure, it cannot eliminate the point pressure of this test
Regardless of the resistance obtained by the DC resistance test method or the resistance part separated from the AC impedance spectrum, the total resistance part is composed of three parts: solution resistance, interface resistance and resistance of the material to be tested. There is a potential barrier at the interface with the electronically conductive material, and the conductivity of the ionic conductor is low (-2 S / cm) and is significantly affected by temperature, so the resistance of the electrolyte solution is large and fluctuates significantly with the ambient temperature, which will greatly interfere with the judgment of the resistance of the material to be tested, especially for electrolytes whose resistance is lower than that of ion-conducting electrolytes. If there are many composite thin film materials, the error margin of the measurement results will be extremely large, and the resistance judgment of the material will be seriously distorted.

Method used

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  • A method and device for testing the resistance in the thickness direction of a composite thin film material
  • A method and device for testing the resistance in the thickness direction of a composite thin film material
  • A method and device for testing the resistance in the thickness direction of a composite thin film material

Examples

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Effect test

Embodiment 1

[0016]Example 1 The composite thin film material to be tested is the positive pole piece of lithium ion battery (a mixed coating of composite adhesive on both sides of aluminum foil, positive electrode material, conductive agent and other materials), and the pole piece to be tested is cut into a strip sample of 10 × 100mm Several, take two sample stacks: the overlapping area of ​​the sample is 10×90mm, leave 10mm on the left and right to lead out the tabs, sandwich a piece of fiber paper with a length of 5mm×width 1mm×thickness 0.2mm between the overlapping surfaces of the two samples, two Add a piece of smooth glass sheet with length 90×width 15×thickness 2mm on the outside of the sample to clamp the sample pair in the middle, and then clamp the outer glass sheet with a clamp to make the sample pair 1 to be tested. After lamination is completed, the conductive polymer layer will be formed according to the types of monomer solution and oxidant-containing liquid shown in Table 1...

Embodiment 2

[0017] Example 2 The composite film material to be tested is a supercapacitor pole piece (a mixed coating of composite adhesives on both sides of aluminum foil and electrode materials, conductive agents, etc.), and the pole piece to be tested is cut into Φ20mm discs with 10×5mm rectangles to draw out There are several samples of the ear, and two sample stacks are taken: the overlapping part of the sample is a Φ20mm circular piece, and a piece of Φ25mm circular fiber paper is sandwiched between the overlapping surfaces of the two samples, and a piece of length 22× is added to the outside of the two samples A smooth ceramic sheet with a width of 22 x a thickness of 1 mm sandwiches the sample pair in the middle, and then clamps it on the outer glass sheet with a clamp to make the sample pair 2 to be tested. After lamination is completed, the conductive polymer layer will be formed according to the types of monomer solution and oxidant-containing liquid shown in Table 1, and the im...

Embodiment 3

[0018] Example 3 The composite film material to be tested is an aluminum-carbon composite foil for the negative electrode of a solid aluminum electrolytic capacitor (composite carbon layers on both sides of the aluminum foil). The area is 10×90mm, leaving 10mm on the left and right to lead out the tabs, sandwiching a layer of 12×95mm fiber paper between the overlapping surfaces of the two samples, and then adding a piece of 90×width 15×thick 2mm fiber paper on the outside of the two samples The smooth tile sandwiches the sample pair in the middle, and then clamps it on the outer ceramic tile with a clamp to make the sample pair 3 to be tested. After lamination is completed, the conductive polymer layer will be formed according to the types of monomer solution and oxidant-containing liquid shown in Table 1, and the immersion-polymerization procedure shown in Table 2. After the synthesis is completed, use a resistance meter to test the resistance of the two lead tabs.

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Abstract

The invention brings forward a method and apparatus for testing thickness-direction resistance of composite thin film materials. The test method is characterized in that after a conductive high-polymer layer is generated through in situ polymerization between two composite thin film materials to be tested with a controllable interval, resistance between two lead-out tabs reserved by the materials to be tested is tested for representing the thickness-direction resistance of the composite thin film materials to be tested. The test apparatus is structurally characterized in that a plurality of clamping devices are arranged in a heating cavity for clamping samples, an immersion disc with a drain valve is arranged below the clamping devices, one liquid storage liquid injection device can inject monomers, an oxidizing agent and a cleaning liquid into the immersion disc, the whole process of polymerizing the conductive high-polymer layer on the samples can be realized in a program control mode, and the clamping devices are provided with resistance test clamp chucks which are connected with resistors outside the cavity for testing resistance. The method and apparatus provided by the invention can accurately represent the thickness-direction resistance of the composite thin film materials at a normal state of no concentrated mechanical pressure, the test result is stable, the repeatability is high, and the test apparatus is stable, reliable and highly automatic.

Description

technical field [0001] The invention relates to a method and a device for testing the resistance in the thickness direction of a composite film material. Specifically, the invention relates to the field of resistance testing methods for conductive composite thin film materials. Background technique [0002] The existing method for characterizing the thickness direction resistance of composite thin film materials is the four-probe method to measure the square resistance (referred to as the square resistance). The probe is connected to the square resistance tester by four leads. When the probe is pressed on the conductive film material, the square resistance meter can immediately display the square resistance value of the material. The specific principle is that the two probes at the outer end generate a current field , the two probes on the inner end test the potential formed by the current field on these two probe points, because the greater the square resistance, the great...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/14
CPCG01R27/14
Inventor 李荐黄祖琼
Owner 宇东箔材科技南通有限公司
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