Integrated circuit testing circuit structure capable of realizing single-port multifunctional multiplexing

Abstract

The invention relates to an integrated circuit testing circuit structure capable of realizing single-port multifunctional multiplexing. The circuit structure includes a port conversion module, a test state determination module, and a clock data separation module; the port conversion module converts the port between the input state and the output state, discriminates the input data and output data, realizes the data exchange between a test machine and a test circuit; the port conversion module is connected with an internal circuit and the test machine, the test state determination module determines whether an input signal determination circuit enters into the test state, the test state determination module is connected with the clock data separation module, the port conversion module and the internal circuit, the clock data separation module separates the input data into a clock signal and a data signal and transmits the input data to the internal circuit, and the clock data separation module is connected with the port conversion module and the internal circuit. By means of such a circuit structure, only one present port can realize the wafer testing and packaged testing of an integrated circuit, so that the circuit structure is wide in application.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to the technical field of integrated circuit testing, and specifically refers to a circuit structure for integrated circuit testing that realizes single-port multifunctional multiplexing. Background technique [0002] With the rapid advancement of science and technology, people can manufacture integrated circuits with large scale, structural load and high integration. They have larger chip core area and more peripheral ports. The core circuit of the chip completes the main functions of the chip; the port is responsible for the communication between the internal circuit of the circuit and the peripheral devices, and is connected to the outside through bonding wires such as copper wires or gold wires. Both are indispensable. However, in some applications, system designers do not have very high requirements for integrated circuit functions, and even some single ones. At th...

AI Technical Summary

Problems solved by technology

[0010] In method 1, the circuit design needs to add an additional port, which only completes the function of the circuit entering the test mode, and has no effect in the actual application of the circuit. This is for circuits with a large proportion of the port area in the entire circuit area. undoubtedly a waste

[0011] In method 2, although one port is borrowed and no additional ports are added, this technology multiplexes other ports, and the finished product test of the circuit can only be done on the tester

When the circuit is soldered on the application circuit, real parameters such as parasitic parameters, electromagnetic interference, and actual environmental heat dissipation conditions are added to the periphery of the circuit. The influence of these peripheral environments on the circuit cannot be tested by this method.

This method generates a test pulse by judging the borrowed port level. The circuit principle is relatively simple. When an interfering voltage signal is generated on the port, since the circuit only counts and decodes the clock signal, the circuit is prone to misjudgment and enters the test state. , affecting the function of the circuit when it is actually used

At the same time, due to the addition of an analog comparator in the circuit, the comparator consumes the current of the circuit when it is in the working state in the circuit, so it cannot be used in occasions that require high static current.

Therefore, the circuit tested by this method may not necessarily pass the actual application board. This method only outputs the state of the internal circuit during the test, and cannot perform interactive tests by inputting test instructions, so it can only test some simple functions. , for low-frequency circuits that are less affected by the external environment, the applicable circuit range is narrow

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