High-temperature thin film strain meter of composite protection layer and preparation method thereof

A technology of protective layer and strain gauge, which is applied in the direction of coating, manufacturing microstructure devices, metal material coating technology, etc., can solve the problem of unstable resistance value, prevent oxidation, prevent resistance value change, and ensure normal operation Effect

Active Publication Date: 2018-05-29
SHANGHAI JIAO TONG UNIV
View PDF5 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] High temperature PdCr thin film strain gage, in the process of high temperature measurement, due to the corrosion of PdCr

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-temperature thin film strain meter of composite protection layer and preparation method thereof
  • High-temperature thin film strain meter of composite protection layer and preparation method thereof
  • High-temperature thin film strain meter of composite protection layer and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044]The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0045] Such as figure 1 , figure 2 Shown is a schematic structural diagram of a high temperature strain gauge deposited directly on a metal component, where figure 1 for figure 2 cutaway view.

[0046] see figure 1 , figure 2 , a high-temperature film strain gauge with a composite protective layer deposited directly on a metal structure, comprising: a high-temperature alloy member substrate 1, an alloy transition layer 2, an alumina insulating layer 3, an alumina protective layer 4, an alum...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to view more

Abstract

The invention relates to a high-temperature thin film strain meter of a composite protection layer and a preparation method thereof. The strain meter comprises a high-temperature alloy component substrate, an alloy transition layer, an aluminum oxide insulating layer, an aluminum oxide protection layer, an aluminum intermediate layer, a PdCr strain layer and a Pt electrode. the strain meter takesa high-temperature alloy component as a substrate, a transition layer alloy is firstly subjected to magnetron sputtering on the substrate and is subjected to high-temperature oxidation to generate a thin-layer aluminum oxide film, the aluminum oxide insulating film is deposited by double ion beam sputtering, and a PdCr strain layer is subjected to radio frequency magnetron sputtering on the insulating film, and the ion beams sputter AL intermediate layer and an AL2O3 protective layer. The strain meter is suitable for the real-time measurement of the strain of a component in the high-temperature working process, a universal MEMS patterning process is adopted, and the PDCR is sputtered to serve as a strain layer, the ion beams sputter to prepare Al and Al2O3 to obtain a composite protectionlayer by heat treatment, so that the oxidation of the PdCr thin film is prevented, and the oxidation resistance and the stability of the strain meter are improved.

Description

technical field [0001] The invention relates to the technical field of thin-film sensor design and production, in particular to a high-temperature thin-film strain gauge with low drift rate prepared in situ on a high-temperature alloy component and a preparation method thereof. Background technique [0002] With the development of space technology and nuclear industry, a large number of components are required to work in high temperature environment. For components that operate at high temperatures for a long time, for example, in modern turbine aeroengine technology, turbine blades work in extreme environments of high temperature, high pressure, and high corrosion, and their load and creep are the main factors that cause failure. The strain detection of components puts forward very high requirements. In addition, the design and material selection of turbine blades has become a crucial link in the design and manufacture of engines. In order to determine the structural mode...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01L9/06B81B7/00B81C1/00
Inventor 杨伸勇张丛春林兴楷汪红巫永鹏张晓静李冬洋丁桂甫
Owner SHANGHAI JIAO TONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products