Silicon controlled rectifier device and preparation method thereof
A technology of silicon devices and conductive types, which is applied in the field of thyristor devices and its preparation, can solve the problems of large isolation area, poor product consistency, and restrictions on the improvement and upgrading of thyristor device products, so as to reduce the device area and improve The effect of flexible manufacturing capability, device consistency and yield improvement
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Embodiment 1
[0053] like figure 1 As shown, this embodiment relates to a thyristor device, specifically, the thyristor device includes: a substrate of a first conductivity type (such as an N-type substrate) 100 provided with a front surface and a back surface opposite to the front surface, and The first conductivity type substrate 100 is provided with a second conductivity type isolation region 101 (such as a P-type isolation region), which is arranged on the front surface of the first conductivity type substrate 100, and the upper surface of the second conductivity type isolation region 101 The second conductivity type epitaxial layer (such as P-type epitaxial layer) 102 to be covered, the second conductivity type anode disposed on the back surface of the first conductivity type substrate 100, and covering the lower surface of the second conductivity type isolation region 101 layer (such as P-type anode layer) 103, a deep trench structure 105 disposed in the substrate 100 of the first con...
Embodiment 2
[0061] like figure 2 As shown, the present invention also discloses a method for preparing a thyristor device, specifically, the method includes the following steps:
[0062] Step S1, providing a substrate 200 of a first conductivity type (such as an N-type substrate), and the substrate 200 of the first conductivity type has a front surface and a back surface opposite to the front surface, such as image 3 structure shown.
[0063] In a preferred embodiment of the present invention, the above-mentioned first conductivity type substrate 200 has a thickness of 350-600 μm (eg 350 μm, 400 μm, 500 μm or 600 μm, etc.).
[0064] Step S2, etching the substrate 200 of the first conductivity type from the front surface of the substrate 200 of the first conductivity type to form a plurality of first deep trenches 201, such as Figure 4 structure shown; and fill the second conductivity type silicon layer 202 (for example, P-type silicon layer) in several first deep trenches 201, as F...
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