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Technological method for refining three-dimensional reconstructed TEM (transmission electron microscope) sample of amorphous solid alloy and evaluation method

A technology for transmission electron microscope samples and three-dimensional reconstruction, which is applied in the preparation of test samples, material analysis using wave/particle radiation, and measurement devices, which can solve the inapplicability and lack of effective technologies for amorphous solid alloy blocks method, no removal and other problems, to achieve the effect of strong manipulability and repeatability, high technical reliability, and easy implementation

Active Publication Date: 2018-06-19
南京腾元软磁有限公司 +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The main disadvantage of this method is that it does not remove the influence of the damaged layer on the surface of the sample on the image of the two-dimensional transmission electron microscope.
The main disadvantage of this method is that it also does not remove the influence of the damaged layer on the surface of the sample on the two-dimensional transmission electron microscope image.
The main disadvantage of this method is that it is only effective for powder materials, and cannot be used for the preparation of solid thin film samples, and it is not suitable for amorphous solid alloy blocks.
The main disadvantage of this method is that it does not remove the influence of the damaged layer on the surface of the sample on the image of the two-dimensional transmission electron microscope.
[0006] In summary, although amorphous solid alloys can be prepared as thin film samples and their microstructures are characterized by three-dimensional reconstruction technology of transmission electron microscopy, ion bombardment thinning changes the structure of atomic clusters on the surface of amorphous solid alloys (not only changing the surface atomic cluster morphology, but also changing the surface atomic cluster size), the sample surface damage layer still has a certain influence on the two-dimensional transmission electron microscope image, and the removal of the surface damage of the amorphous solid alloy transmission electron microscope film sample is currently And evaluation still lacks effective technical methods, because the application of transmission electron microscopy three-dimensional reconstruction technology in the microstructure characterization of amorphous solid alloys is not extensive enough, and the research on the microstructure of amorphous solid alloys is not deep enough, systematic and comprehensive. Lack of sufficient understanding of the surface structural damage layer during the preparation of amorphous solid alloy TEM thin film samples

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  • Technological method for refining three-dimensional reconstructed TEM (transmission electron microscope) sample of amorphous solid alloy and evaluation method
  • Technological method for refining three-dimensional reconstructed TEM (transmission electron microscope) sample of amorphous solid alloy and evaluation method
  • Technological method for refining three-dimensional reconstructed TEM (transmission electron microscope) sample of amorphous solid alloy and evaluation method

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Embodiment 1

[0048] Embodiment 1: adopt amorphous solid alloy Zr 48 Cu 45 A l7 (the subscript number in the chemical formula is at%), the amorphous solid alloy rod is prepared by the vacuum copper mold suction casting method commonly used in this field.

[0049] The specific operation steps of a kind of process method of refining amorphous solid alloy three-dimensional reconstruction transmission electron microscope sample proposed by the present invention are as follows:

[0050] Step 1: Prepare an amorphous solid alloy transmission electron microscope sample in the shape of a film or with a nanoscale needle-like end, including the following sub-steps in turn: (1) Select the temperature of the alloy melt to be 1200 ° C, and use a vacuum copper mold to suction cast The amorphous solid alloy rod was prepared by the method, and the diameter was 1 mm; (2) the amorphous solid alloy rod was cut into short sections with a length of 10 mm by a diamond linear precision cutting machine (South Bay...

Embodiment 2

[0060] Embodiment 2: adopt amorphous solid alloy Fe 78 Si 12 B 10 (the subscript number in the chemical formula is at%), the amorphous solid alloy thin strip is prepared by the rapid planar flow continuous casting method commonly used in this field.

[0061] The specific operation steps of a kind of process method of refining amorphous solid alloy three-dimensional reconstruction transmission electron microscope sample proposed by the present invention are as follows:

[0062]Step 1: Prepare an amorphous solid alloy TEM sample in the shape of a film or with a nanoscale needle-like end, including the following sub-steps in turn: (1) Select the temperature of the alloy melt to be 1200 ° C, and use rapid planar flow continuous casting The amorphous solid alloy thin strip is prepared by the method, the thickness is 32 micrometers, and the width is 20 mm; (2) the amorphous solid alloy thin strip is cut into a disc with a diameter of 3 mm by an ultrasonic cutting machine (Gatan In...

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Abstract

The invention relates to a technological method for refining a three-dimensional reconstructed TEM (transmission electron microscope) sample of an amorphous solid alloy and an evaluation method. The technological method comprises the following steps: step 1, preparing a TEM sample, which is in a thin film shape or provided with a nanoscale needle-point end part, of the amorphous solid alloy; step2, measuring rupture energy of atomic bonds in the TEM sample of the amorphous solid alloy; step 3, removing a surface damage layer of the TEM sample of the amorphous solid alloy; step 4, evaluating the effect of the TEM sample of the amorphous solid alloy with the surface damage layer removed. The surface damage layer produced in the preparation process of the three-dimensional reconstructed TEMsample of the amorphous solid alloy can be removed, the effect of removal of the surface damage layer is evaluated accurately, guarantee is provided for accurate characterization of morphology and spatial distribution of atomic clusters of the amorphous solid alloy, and the foundation is laid for improving macroscopic performance of the amorphous solid alloy material.

Description

technical field [0001] The invention belongs to the technical field of metal functional material preparation, and in particular relates to a process method and an evaluation method for refining a three-dimensional reconstructed transmission electron microscope sample of an amorphous solid alloy. Background technique [0002] The microstructure of materials is the basis for realizing the macroscopic properties of materials, and materials with the same composition but different microstructures can show significant differences in macroscopic properties. Therefore, adjusting the microstructure of materials with the help of modern high-tech means is the key to realizing the optimization of various properties of materials. An important way to support the rapid and continuous development of materials science and technology. To control the microstructure of materials, it is necessary to know the microstructure of materials. The control effect of material microstructure also needs to...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/22G01N1/28
CPCG01N23/22G01N23/2202
Inventor 王岩国
Owner 南京腾元软磁有限公司
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