System and method for performing lock-phase thermography chromatography characterization on microdefects of solar cell

A solar cell and thermal imaging technology, which is applied in the direction of optical testing of flaws/defects, material analysis, and material analysis through optical means, can solve problems such as accelerating the lateral positioning and identification of defects, and achieve improved detection capabilities, large detection areas, and improved The effect of the signal-to-noise ratio

Inactive Publication Date: 2018-08-24
HARBIN INST OF TECH
View PDF5 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the above difficulties, the present invention provides a lock-in thermal imaging tomographic characterization system and method for micro-defects in solar cells. Using lock-in thermal imaging detection technology, the surface temperature or thermal wave signal information of different modulation frequencies can be obtained, and the characteristics can be analyz

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System and method for performing lock-phase thermography chromatography characterization on microdefects of solar cell
  • System and method for performing lock-phase thermography chromatography characterization on microdefects of solar cell
  • System and method for performing lock-phase thermography chromatography characterization on microdefects of solar cell

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0031] Specific implementation mode one: as figure 1 and 2 As shown, the lock-in thermal imaging tomography characterization system for integrated circuit micro-defects provided in this embodiment consists of a three-dimensional mobile stage, a short-wave infrared camera 3, a metal sample stage 5, a solar cell sample 6, a sample holding device 7, DC power supply negative output line 8, DC power supply positive output line 9, lock-in thermal imaging tomography software 10, computer 11, DC power supply 12, first signal transmission line 13, data acquisition card 14, second signal transmission line 15, third signal The transmission line 16, the fourth signal transmission line 17, the fifth signal transmission line 18, the sixth signal transmission line 19 and the mid-wave infrared camera 22 are formed, wherein:

[0032] The three-dimensional mobile platform is composed of the first Z-direction platform 1, the first Y-direction platform 2, the X-direction platform 3, the second ...

specific Embodiment approach 2

[0041] Embodiment 2: This embodiment provides a method for using the system described in Embodiment 1 to perform lock-in thermal imaging tomography characterization of micro-defects in integrated circuits. The specific implementation steps of the method are as follows:

[0042] Step (1): Determine the solar cell sample 6 to be measured, place it on the metal sample stage 5, and make the sample clamping device 7 in good contact with the negative electrode of the solar cell sample 6;

[0043] Step (2): Turn on the lock-in thermal imaging tomography system for micro-defects in solar cells. This step includes a computer 10, a data acquisition card 14, a DC power supply 11, a short-wave infrared camera 3, a mid-wave infrared camera 22, and a three-dimensional mobile station. power on;

[0044] Step (3): Connect the positive output line 9 of the DC power supply to the metal sample table 5 (the positive electrode of the solar cell sample 6 is in good contact with the metal sample tab...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a system and a method for performing lock-phase thermography chromatography characterization on microdefects of solar cells. The system comprises a short-wave infrared camera,a medium-wave infrared camera, a data acquisition card, a computer, a three-dimensional mobile station, a metal sample piece table, a sample piece clamping device and a direct current (DC) power supply, wherein the computer is used for controlling the data acquisition card to control the DC power supply to be triggered and carrying out amplitude modulation change on sample pieces, and simultaneously controls the data acquisition card to control the short-wave infrared camera and the medium-wave infrared camera to synchronously trigger the acquisition of an image sequence; images acquired by the short-wave infrared camera are transmitted to the computer, so that the lateral distribution and positioning of the defects of the sample pieces can be obtained; images acquired by the medium-wave infrared camera are transmitted to the computer, so that an amplitude figure and a phase diagram at the frequency can be obtained; amplitude figures and phase diagrams at different frequencies are obtained by changing the frequency; the deep chromatography results of the sample pieces can be obtained by using lock-phase thermography chromatography software. The method provided by the invention is anew rapid, large-area, visual and accurate infrared heat wave nondestructive testing method.

Description

technical field [0001] The invention belongs to the field of photovoltaic technology, and relates to a phase-locked thermal imaging tomography characterization system and method of solar cells, which are suitable for rapid quantitative detection of micro-defect depth direction resolution of solar cells. Background technique [0002] As the core device for converting light energy into electrical energy, solar cells play an increasingly important role in today's production needs. Due to unreasonable factors such as design, production and use, different defects (broken grid, hidden cracks, impurity pollution, etc.) will occur. These defects will reduce the output efficiency of solar cells and cause solar cells to fail in severe cases. The performance of the battery and the timely detection of the performance of the solar cell are of great significance. Optical imaging methods play an irreplaceable role in the field of solar cell inspection. Currently commonly used optical det...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/88
CPCG01N21/8851G01N2021/888G01N2021/8887
Inventor 宋鹏刘俊岩徐宏图王飞王扬
Owner HARBIN INST OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap