System and method for performing lock-phase thermography chromatography characterization on microdefects of solar cell

Abstract

The invention discloses a system and a method for performing lock-phase thermography chromatography characterization on microdefects of solar cells. The system comprises a short-wave infrared camera,a medium-wave infrared camera, a data acquisition card, a computer, a three-dimensional mobile station, a metal sample piece table, a sample piece clamping device and a direct current (DC) power supply, wherein the computer is used for controlling the data acquisition card to control the DC power supply to be triggered and carrying out amplitude modulation change on sample pieces, and simultaneously controls the data acquisition card to control the short-wave infrared camera and the medium-wave infrared camera to synchronously trigger the acquisition of an image sequence; images acquired by the short-wave infrared camera are transmitted to the computer, so that the lateral distribution and positioning of the defects of the sample pieces can be obtained; images acquired by the medium-wave infrared camera are transmitted to the computer, so that an amplitude figure and a phase diagram at the frequency can be obtained; amplitude figures and phase diagrams at different frequencies are obtained by changing the frequency; the deep chromatography results of the sample pieces can be obtained by using lock-phase thermography chromatography software. The method provided by the invention is anew rapid, large-area, visual and accurate infrared heat wave nondestructive testing method.

Description

technical field [0001] The invention belongs to the field of photovoltaic technology, and relates to a phase-locked thermal imaging tomography characterization system and method of solar cells, which are suitable for rapid quantitative detection of micro-defect depth direction resolution of solar cells. Background technique [0002] As the core device for converting light energy into electrical energy, solar cells play an increasingly important role in today's production needs. Due to unreasonable factors such as design, production and use, different defects (broken grid, hidden cracks, impurity pollution, etc.) will occur. These defects will reduce the output efficiency of solar cells and cause solar cells to fail in severe cases. The performance of the battery and the timely detection of the performance of the solar cell are of great significance. Optical imaging methods play an irreplaceable role in the field of solar cell inspection. Currently commonly used optical det...

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the above difficulties, the present invention provides a lock-in thermal imaging tomographic characterization system and method for micro-defects in solar cells. Using lock-in thermal imaging detection technology, the surface temperature or thermal wave signal information of different modulation frequencies can be obtained, and the characteristics can be analyzed. Combining information with thermal physical parameters of solar cell materials and thermal wave diffusion theory to achieve defect tomography at different depths, using electroluminescence technology to assist, speeding up the lateral positioning and identification of defects. It is a fast, large-area, intuitive and accurate infrared thermal wave New method of non-destructive testing

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