The invention provides a preparation method of a static random access memory. According to the preparation method, pre-amorphization ion implantation is performed on a part of a polycrystalline silicon layer before N-type ion implantation is performed, so that the condition that implanted ions longitudinally diffuse, penetrates a gate oxide layer and enters a P well region due to overlarge grain size in the polycrystalline silicon layer in the N-type ion implantation process can be prevented, so that the reduction of the threshold voltage of a subsequently formed pull-down NMOS transistor caused by the above condition can be avoided, and the voltage mismatch can be avoided; meanwhile, the inhibition effect of N-type ion implantation on a polycrystalline depletion effect is improved; and besides, a pull-up PMOS transistor and a pull-down NMOS transistor which are formed subsequently share the same gate structure, so that transverse diffusion of ions in the N-type ion implantation can be inhibited by executing the pre-amorphization ion implantation, the influence of the N-type ion implantation on the threshold voltage of the pull-up PMOS transistor formed subsequently is avoided, and the problem of voltage mismatch is relieved, and device performance can be improved. The same mask is used for two times of ion implantation, and therefore, the preparation cost is low, and the process is simple.