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Infrared Gas Imaging Focal Plane and Imaging Method Based on Dual Sensitive Element Differential Signal

A technology of gas imaging and sensitive elements, applied in the field of infrared focal plane, can solve the problems of small effective dynamic detection range, inability to completely eliminate background photocurrent, and low detection sensitivity, and achieve large dynamic detection range, high gas detection sensitivity, and large The effect of dynamic range

Active Publication Date: 2020-08-07
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to propose an infrared focal plane composed of combined sensitive elements to form basic picture elements, to provide a new infrared gas imaging method, to solve the problem that the existing gas imaging focal plane cannot completely eliminate background photocurrent, low detection sensitivity and Problems with small effective dynamic detection range

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  • Infrared Gas Imaging Focal Plane and Imaging Method Based on Dual Sensitive Element Differential Signal
  • Infrared Gas Imaging Focal Plane and Imaging Method Based on Dual Sensitive Element Differential Signal
  • Infrared Gas Imaging Focal Plane and Imaging Method Based on Dual Sensitive Element Differential Signal

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Embodiment Construction

[0019] According to the technical scheme of the present invention, the infrared gas imaging focal plane based on the differential signal of dual sensitive elements can realize gas detection imaging of near, middle and far infrared waves. The basic structure of the imaging focal plane of the present invention is as attached figure 1 And figure 2 Shown. The following is a specific example to illustrate the imaging principle and method of the present invention. This example is for the SF whose fingerprint wavelength is 10.6μm. 6 Gas design, SF 6 It strongly absorbs infrared radiation near 10.6μm, and its transmission spectrum is as attached image 3 Shown.

[0020] In this example, the sensitive element A and B are made of GaAs / AlGaAs quantum well materials, which are grown by molecular beam epitaxy. The intrinsic absorption peak of the quantum well material is designed to be around 10.6μm. Its spectral response curve is shown in the attached file. Figure 4 Shown. The grown quantu...

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Abstract

The invention discloses an infrared gas imaging focal plane based on a double-sensitive element differential signal. The focal plane is composed of a pixel array chip and a reading circuit chip, wherein each pixel on the pixel array chip is composed of a sensitive element A and a sensitive element B. The response peak of the sensitive element B is designed at a fingerprint wavelength with strong absorption of the to-be-detected gas, and the response peak of the sensitive element A is modulated to stagger the wavelength. The signal output ends of the sensitive element A and the sensitive element B are connected with a differential circuit, and the differential circuit is used as a part of a reading circuit input stage to output the differential signal to the reading circuit. The signal is in proportion to the concentration and amount of the to-be-detected gas at a probe light path, and the reading circuit is used to output the differential signal for imaging the detected gas. The methodhas the following advantages that 1) the background radiation influence can be directly eliminated; 2) an effective signal proportion related to the gas imaging is high, 3) the integrating capacitoris not easily saturated, and an effective signal dynamic scope is large; and 4) the background radiation noise can be eliminated.

Description

Technical field [0001] The present invention relates to an infrared focal plane of photoelectric detection technology, and specifically refers to an infrared focal plane in which the basic image element has a combined sensitive element structure, and gas detection and imaging are performed by combining differential signals of the sensitive elements. Background technique [0002] Most of the gases are invisible to the naked eye, and some of them are dangerous. There are many occasions in modern industry to deal with these gases. The technology for detecting these gases has important applications in the fields of chemical industry, mining, electric power and environmental protection. For example, in the field of power facilities, there is an urgent need to remotely detect and locate sulfur hexafluoride (SF 6 ) Leaked technology and equipment, SF 6 Gas is used as an insulating medium in high-voltage circuit breakers and switchgear. Once leakage occurs, it will cause harm to power fac...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/3504G01J5/00
CPCG01J5/0014G01J2005/0077G01N21/3504
Inventor 陆卫聂晓飞甄红楼李宁陈效双
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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