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Planar LED epitaxial structure based on gallium arsenide substrate and manufacturing method thereof

An epitaxial structure, gallium arsenide technology, applied in the field of planar LED epitaxial structure and its fabrication, can solve the problems of reducing product reliability, falling off light-emitting units, limiting the size of micro-led display array units, etc. Effect

Active Publication Date: 2018-09-18
江西锐芯微电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] (1) Cutting is used to form the isolation of the light-emitting unit. During the cutting process, there are cracks, contamination, damage, etc. on the material of the light-emitting unit by the cutting knife, so that the light-emitting unit becomes invalid;
[0009] (2) The material is attached to the silicon wafer substrate in the form of adhesion before cutting and isolation. On the one hand, it increases the technical operation steps, and at the same time, there is also the possibility of weak adhesion during the bonding process, which may cause the light-emitting unit to fall off. Sex, reducing the reliability of the product;
"method, cut the P-type layer of the row block to form the independence of the P-type region of the light-emitting unit, but this operation is also easy to cause the GaAs substrate material used as the N-type connection to detach, thereby destroying the matrix. N type row connection
[0011] (4) Due to the cutting method, the depth that the connection of the P-type electrode needs to cross is the thickness of the material itself, generally reaching about 200um, and the width is the width of the cutting blade. This channel not only limits the micro-led The unit size of the display array also makes it extremely difficult to make the connection of the P-type layer by the general metal coating method
[0016] However, when thicker GaP is used for micro-LED display, since the GaP layer is transparent, more side light appears, which makes the unit light-emitting pixel interface of LED micro-display blurred (the light-emitting interface of the pixel is not clear)
On the other hand, the thicker GaP layer 106 and AlInP layer 105 increase the difficulty of isolating the P plane. In the ZL101625981A patent, cutting is used for isolation. Damage to epitaxial luminescent materials such as contamination
[0017] It can be seen from the above prior art background that in the prior art LED epitaxial material structure, since the GaAs substrate is integrally conductive, it is difficult to cut and form independently controllable pixel units of the LED matrix while making the addressing of the single elements in the matrix. circuit
At the same time, due to the thick thickness of the GaP light guide layer, there is also the problem of light crossing on the side of the adjacent unit after cutting.

Method used

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  • Planar LED epitaxial structure based on gallium arsenide substrate and manufacturing method thereof
  • Planar LED epitaxial structure based on gallium arsenide substrate and manufacturing method thereof
  • Planar LED epitaxial structure based on gallium arsenide substrate and manufacturing method thereof

Examples

Experimental program
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Effect test

Embodiment 1

[0049] S1: Take a 2-inch N-type GaAs substrate with crystal orientation 0 >, the thickness is about 290um, using sulfuric acid: water: hydrogen peroxide = 3:1:1, at 45 ℃, carry out chemical cleaning in the mixed solution for 2Min, then wash away the deionized water, and then spin dry with nitrogen after 10Min.

[0050] S2: Put the gallium arsenide substrate prepared in step S1 into the MOCVD epitaxial furnace, and grow an N-type GaAs buffer layer with a thickness of about 0.3-1.0um and a carrier concentration of about (1-8)×10 17 , the N-type GaAs buffer layer is used to achieve lattice matching with the GaAs substrate, and provides a fresh interface for the next growth; the N-type GaAs buffer layer is also a GaAlAs buffer layer.

[0051] S3: grow a P-type GaAs epitaxial layer on the N-type GaAs buffer layer, the thickness of which is in the range of 0.5-2um, and the carrier concentration range is (1-10)×10 17 . The P-type GaAs layer may also be a P-type GaAlAs layer or a com...

Embodiment 2

[0058] S1: Take a 2-inch high-resistance GaAs substrate with a crystal orientation of and a thickness of about 250um. Use sulfuric acid: water: hydrogen peroxide = 3:1:1, and conduct 2Min in the mixed solution at a temperature of 45°C. After chemical cleaning, rinse with deionized water for 10 minutes, and then spin dry with nitrogen gas for later use.

[0059] S2: Put the arsenized substrate prepared in step S1 into an MOCVD epitaxial furnace, grow an N-type GaAs buffer layer with a thickness of about 0.3-1.0um, and the N-type GaAs buffer layer is used to achieve lattice matching with the GaAs substrate , and provide a fresh interface for the next step of growth.

[0060] S3: grow a P-type GaAs epitaxial layer on the N-type GaAs buffer layer, the thickness of which is in the range of 0.5-2um, and the carrier concentration range is (1-10)×10 17 . The P-type GaAs epitaxial layer may also be a P-type GaAlAs layer or a composite structure of GaAlAs / GaAs.

[0061] S4: growing ...

Embodiment 3

[0067] S1: Take a 2-inch intrinsic type GaAs substrate, crystal orientation 0 >, the thickness is about 320um, using sulfuric acid: water: hydrogen peroxide = 3:1:1, at 45°C, carry out chemical cleaning in the mixed solution for 2Min, then wash away the deionized water for 10Min and then spin dry with nitrogen for later use.

[0068] S2: Put the arsenized substrate prepared in step S1 into an MOCVD epitaxial furnace to grow a GaAlAs buffer layer with a thickness of about 0.3-1.0um, and then grow an N-type GaAs buffer layer with a thickness of about 0.3-1.0um.

[0069] S3: grow a P-type GaAs epitaxial layer on the N-type GaAs buffer layer, the thickness of which is in the range of 0.5-2um, and the carrier concentration range is (1-10)×10 17 . The P-type GaAs layer may also be a P-type GaAlAs layer or a composite structure of GaAlAs / GaAs.

[0070] S4: growing an N-type GaAs epitaxial layer on the P-type GaAs epitaxial layer; the N-type GaAs epitaxial layer is also an N-type GaA...

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Abstract

The invention provides a planar LED epitaxial structure based on gallium arsenide substrate and a manufacturing method thereof. The epitaxial structure is composed of the following components from bottom to top: an N-type GaAs substrate layer, an N-type GaAs buffer layer, a P-type GaAs epitaxial layer, an N-type GaAs epitaxial layer, an N-type AlInP restriction layer, an MQW quantum well light emitting layer, a P-type AlInP restriction layer and a P-type GaP window layer. The manufacturing method comprises the steps of (1), supplying a GaAs substrate and cleaning; (2), growing a P-GaAs epitaxial layer; (3), growing an N-GaAs epitaxial layer; (4), growing an N-GaAs epitaxial layer; (5), growing an N-AlInP epitaxial layer; (6), growing an MQW light emitting layer; (7), growing a P-AlInP epitaxial layer; and (8), growing a P-GaP epitaxial layer. According to the planar LED epitaxial structure, electric isolation between the MQW quantum well light emitting layer and the substrate materialis formed by means of a reversal NP junction; and furthermore a relatively thin P-type GaP expansion layer is designed, thereby facilitating relation of an addressing circuit of an LED micro-display matrix, preventing unit pixel damage and falling in performing cutting isolation on the light emitting unit, and keeping integrity of the LED micro-display array.

Description

technical field [0001] The invention relates to a planar LED epitaxial structure based on a gallium arsenide substrate and a manufacturing method thereof, belonging to the field of optoelectronic technology. Background technique [0002] LED display is an active semiconductor electroluminescent device that converts electricity into light. Each light-emitting point in the LED display matrix can use the principle of dot matrix addressing to realize the individual drive control of the current. A light-emitting unit that can be individually controlled is a pixel; the LED display matrix can be used to display various information such as text, graphics, images, and video signals. The pixels in the commonly used LED display modules are light-emitting diodes individually fixed on the circuit board. There is a circuit on the circuit board that provides power drive and control for each pixel. The distance is limited, and the pixel density per unit area is much lower than that of LCD ...

Claims

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Application Information

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IPC IPC(8): H01L33/00H01L33/06H01L33/14H01L33/30
CPCH01L33/0016H01L33/0062H01L33/06H01L33/145H01L33/30
Inventor 万金平于天宝
Owner 江西锐芯微电子科技有限公司
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