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Method and system for processing long pulse infrared non-destructive detection sequence image

An infrared image processing and infrared image technology, applied in image data processing, image enhancement, image analysis, etc., can solve problems such as unsuitable for carrying, unsuitable for industrial non-destructive testing, complex equipment, etc., to facilitate quantitative calculation and clearly display the shape of defects and position, the effect of eliminating noise

Active Publication Date: 2018-12-21
SHANGHAI UNIV
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  • Summary
  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

This technique is less affected by uneven heating and the surface of the material, but it requires frequency modulation of the excitation heat source, and the equipment is more complicated and not suitable for carrying
[0004] Phase-locked thermography can only use a fixed frequency for excitation in one test, which requires multiple tests to detect all the defects when testing samples with defects of different depths. The efficiency is low and it is not suitable for practical applications. In the industrial non-destructive testing
However, the flashlight excitation equipment required by the pulse thermal imaging method is a high-power flashlight, which is complex, expensive and inconvenient to carry, which limits the application of this method in the field of non-destructive testing, especially in non-fixed testing sites.

Method used

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  • Method and system for processing long pulse infrared non-destructive detection sequence image

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Effect test

Embodiment 1

[0225] The detection method and system of the present invention are used in the detection of a glass fiber laminate with a size of 200×150×6mm containing hole-type defects on the back, so as to determine the location of the defect and quantitatively measure the diameter and location of the hole defect on the back.

[0226] The physical picture of the sample is shown in Figure 3, and the defect distribution is as follows Figure 4a and Figure 4b As shown, the specific detection process is:

[0227] Fix the sample on the test platform, the detection surface is located directly in front of the infrared thermal imager, ensure that the sample and the infrared thermal imager are at the same level, the infrared thermal imager is 1.5m away from the sample surface, and the excitation device is to the sample surface 0.5m to ensure the best detection results.

[0228] Open the infrared image processing software (including the software of the above-mentioned sequential infrared image p...

Embodiment 2

[0235] The detection method and system of the present invention are used for the detection of a carbon fiber laminate sample, and the sample size is 250 * 80 * 4mm, 7a and Figure 7b It is a physical photo of the carbon fiber laminate, and the diameter and depth of the blind hole are detailed in Figure 8 , "D6H1.7" in the figure indicates that the diameter of the blind hole is 6mm, and the depth of the blind hole is 1.7mm, that is, the defect depth is 2.3mm (the plate thickness is 4mm).

[0236] According to the method provided by the invention, the specific measurement process is:

[0237] Before the experiment, paint the surface with matte black acrylic spray paint to maximize the absorption of excitation light energy and increase the emissivity.

[0238] Place the position of the thermal imaging camera and ensure that the surface of the sample is in the center of the field of view of the thermal imaging camera. Ensure that the sample and the thermal imaging camera are at ...

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Abstract

The invention discloses a method and system for processing a long pulse infrared non-destructive detection sequence image. The method comprises the following steps such as polynomial fitting, fast Fourier processing, pixel point processing, gray level expansion, detail enhancement, data conversion, sequence diagram processing, and defect summary. The processing method, processing device and detection system and detection method provided by the invention are very efficient in non-destructive detection and evaluation of composite materials, have the cost only a percentage of the pulse thermal loading device and high excitation energy, and is suitable for the detection of large depth defects in metal materials and composite materials. In addition, an ordinary halogen infrared lamp is as the light source, and defect details are specifically enhanced by using sequence image processing methods. The image processing method and image processing device and detection system and detection methodprovided by the invention are economical and practical.

Description

technical field [0001] The present invention belongs to the technical field of defect detection, and specifically relates to a method and system for processing images of long-pulse infrared non-destructive testing sequence images, more precisely, a non-destructive testing technology based on infrared thermal imaging, including a processing method and device for sequence infrared images, and a device based on the device. Infrared non-destructive testing system and method. Background technique [0002] Infrared thermal imaging nondestructive testing technology is a new type of nondestructive testing technology. Compared with traditional nondestructive testing techniques (eddy current, ultrasonic, X-ray, etc.), it has the advantages of simple operation, high detection efficiency, and large single detection area. It has been widely used in aerospace, industrial design, electric power and other fields, and has broad development prospects. [0003] Infrared thermal imaging non-de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G06T5/50G06T7/00
CPCG01N21/8851G01N2021/8887G06T5/50G06T7/0004G06T2207/10016G06T2207/10048G06T2207/20056G06T2207/20221
Inventor 张东升魏延杰
Owner SHANGHAI UNIV
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