Preparation method of PERC battery as well as double-faced selective emitter PERC battery
An emitter, selective technology, applied in circuits, electrical components, climate sustainability, etc., can solve problems such as the inability to achieve good double-sided battery back printing, poor product results, and inability to achieve mass production. The cost of equipment and materials is limited, the yield is high, and the effect of improving quality
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Embodiment 1
[0040] Such as figure 1 As shown, a method for preparing a double-sided selective emitter PERC battery in this embodiment includes the following steps:
[0041] Step S1: Front side doping of silicon wafer
[0042] Select P-type monocrystalline silicon wafers, first perform pre-cleaning and surface texturing, and then use low-pressure or normal-pressure diffusion furnaces to lightly dope phosphorus elements on the front to form N+ lightly doped regions. The doping concentration of N+ lightly doped regions is 3*E+20 / cm 3 , The square resistance is 120Ω / port.
[0043] The laser is used to heavily dope the front side of the silicon wafer to form a local N++ heavily doped region, and the doping concentration of the N++ heavily doped region is 2*E+20 / cm 3 , The sheet resistance is 70Ω / port.
[0044]The parameters of the laser in this step are as follows: the laser is a 532nm green laser, the laser power is 30W, the laser frequency is 250KHz, the laser running speed is 13m / s, and...
Embodiment 2
[0064] Such as figure 1 As shown, a method for preparing a double-sided selective emitter PERC battery in this embodiment includes the following steps:
[0065] Step S1: Front side doping of silicon wafer
[0066] Select P-type monocrystalline silicon wafers, first perform pre-cleaning and surface texturing, and then use a low-pressure or normal-pressure diffusion furnace to lightly dope phosphorus elements on the front to form an N+ lightly doped region. The doping concentration of the N+ lightly doped region is 1*E+20 / cm 3 , The square resistance is 110Ω / port.
[0067] The laser is used to heavily dope the front side of the silicon wafer to form a local N++ heavily doped region, and the doping concentration of the N++ heavily doped region is 2*E+20 / cm 3 , The square resistance is 50Ω / port.
[0068] The parameters of the laser in this step are as follows: the laser is a 532nm green laser, the laser power is 25W, the laser frequency is 200KHz, the laser running speed is 10...
Embodiment 3
[0088] Such as figure 1 As shown, a method for preparing a double-sided selective emitter PERC battery in this embodiment includes the following steps:
[0089] Step S1: Front side doping of silicon wafer
[0090] Select P-type monocrystalline silicon wafers, first perform pre-cleaning and surface texturing, and then use a low-pressure or normal-pressure diffusion furnace to lightly dope phosphorus elements on the front to form an N+ lightly doped region. The doping concentration of the N+ lightly doped region is 6*E+20 / cm 3 , The square resistance is 140Ω / port.
[0091] The laser is used to heavily dope the front side of the silicon wafer to form a local N++ heavily doped region, and the doping concentration of the N++ heavily doped region is 4*E+20 / cm 3 , The square resistance is 80Ω / port.
[0092] The parameters of the laser in this step are as follows: the laser is a 532nm green laser, the laser power is 40W, the laser frequency is 300KHz, the laser running speed is 15...
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