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An In Situ Synchrotron Radiation Characterization Method for Crystallization Kinetics of Amorphous Alloys

A technology of kinetic characteristics and amorphous alloys, which is applied in the characterization of amorphous alloy nanocrystallization characteristics and in-situ synchrotron radiation characterization of amorphous alloy crystallization kinetic characteristics, can solve the problem of inability to analyze the law of atomic migration and diffusion And other issues

Active Publication Date: 2022-03-04
SHANDONG JIANZHU UNIV
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Problems solved by technology

[0007] The technical problem to be solved by the present invention is to change the traditional method of thermally analyzing the crystallization kinetics of amorphous alloys, solve the problem that the traditional thermal analysis method cannot analyze the law of atomic migration and diffusion in the crystallization process, and adopt diffraction analysis technology and The method of combining numerical simulation to obtain the atomic migration and diffusion process, the formation and growth mechanism of crystal nuclei, and the crystallization kinetics during the nanocrystallization process of amorphous alloys, so as to characterize the nanocrystallization process of amorphous alloys

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  • An In Situ Synchrotron Radiation Characterization Method for Crystallization Kinetics of Amorphous Alloys
  • An In Situ Synchrotron Radiation Characterization Method for Crystallization Kinetics of Amorphous Alloys
  • An In Situ Synchrotron Radiation Characterization Method for Crystallization Kinetics of Amorphous Alloys

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Embodiment

[0026] The test adopts the atomic percentage as Zr 48 Cu 36 al 8 Ag 8 amorphous alloys.

[0027] a. Select the nominal composition (atomic percentage) as Zr 48 Cu 36 al 8 Ag 8 Amorphous alloys of Φ5×100mm were obtained by vacuum arc melting (repeated smelting 5 times) and copper mold suction casting, and cut into alloy samples of Φ5×0.5mm;

[0028] b. Place the sample in the diffraction optical path of synchrotron radiation (wavelength 0.01nm) for in-situ isothermal crystallization treatment, the treatment temperature is 470°C, and the radiation data collection frequency is 6 minutes;

[0029] c. Correct and convert the obtained diffraction data to obtain the interference function I(Q) of the alloy, see attached figure 1 , each data point in the figure comes from the experimental data annealed every six minutes, and Fourier transform is performed to obtain the reduced radial distribution function G(r) and radial distribution function RDF(r), etc. See the attached image...

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Abstract

An in-situ synchrotron radiation characterization method for the crystallization kinetics of amorphous alloys belongs to the technical field of nanocrystalline material preparation. Starting from the most fundamental atomic structure, the nanocrystalline formation process is combined with macroscopic production and preparation conditions, so that The analysis is more accurate and reliable.

Description

technical field [0001] The invention belongs to the technical field of preparation of nanocrystalline materials, belongs to the technical field of amorphous alloys, and relates to a technical method for characterizing the nanocrystallization characteristics of amorphous alloys, in particular to an in-situ synchrotron radiation characterization of crystallization dynamics characteristics of amorphous alloys method. Background technique [0002] Amorphous alloys are a new generation of metal materials with long-range disorder and short-range order structures. They have a series of excellent mechanical, physical and chemical properties that cannot be compared with traditional crystalline metal materials, such as high strength, high hardness, and extremely low temperature at room temperature. Large elastic limit and good formability in viscous state, etc., have broad application prospects in the fields of machinery, communication, automobile industry, aerospace and other fields,...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/47
CPCG01N21/4788
Inventor 徐勇徐丽丽商雨新许超陈可欣叶佳硕谷子丰高鑫石磊
Owner SHANDONG JIANZHU UNIV
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