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Semiconductor device and related manufacturing method

A manufacturing method and semiconductor technology, applied in the fields of semiconductor devices, semiconductor/solid-state device manufacturing, electrical components, etc., can solve the problems of increasing device area, increasing the cost of a single chip, intensifying the lateral diffusion of impurities, etc., achieving low annealing thermal budget, The effect of improving surface utilization and reducing annealing time

Pending Publication Date: 2020-08-25
JOULWATT TECH INC LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to more thermal budget, the lateral diffusion of impurities is also intensified, the area of ​​the device will increase, and the cost of a single chip will be increased.

Method used

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  • Semiconductor device and related manufacturing method
  • Semiconductor device and related manufacturing method
  • Semiconductor device and related manufacturing method

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Embodiment Construction

[0039] Various embodiments of the invention will be described in more detail below with reference to the accompanying drawings. In the various drawings, the same elements are denoted by the same or similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale.

[0040] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0041] figure 1 A schematic device cross-sectional structure schematic diagram showing a process schematic of a semiconductor device according to the prior art. As shown in the figure, a semiconductor device 100 in the prior art includes a substrate 110, a buried layer 120, an epitaxial layer 130, a drift region 140, an isolation region 150, a well region 160, a shallow trench isolation region 170, a first doped region 181 , a second doped region 182 , a third doped region 183 , a gate oxide lay...

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Abstract

The invention discloses a semiconductor device and a related manufacturing method. The semiconductor device comprises a substrate, and an isolation region and an epitaxial layer which are arranged onthe substrate in parallel. The epitaxial layer comprises a metal oxide semiconductor device; and the upper layer of the isolation region is a second drift region, the isolation region is divided intotwo layers, the thickness of each layer is smaller than that of the epitaxial layer, so that the thickness of the epitaxial layer can be increased, meanwhile, low annealing heat budget can be maintained, transverse diffusion of impurities is reduced, the surface utilization rate of the semiconductor device is increased, and cost is reduced. According to the manufacturing method of the semiconductor device, manufacturing of the epitaxial layer is divided into multiple layers, and meanwhile, the manufacturing of the isolation region is divided into a plurality of layers matched with the epitaxial layers in number, so that the depth of connection between the isolation regions and between the isolation regions and the adjacent layer is reduced, furthermore, annealing time or / and annealing temperature required for connection are reduced, transverse diffusion of impurities in the isolation regions is reduced, the width of the isolation regions is reduced, the area utilization rate of the semiconductor device is increased, and cost is reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a semiconductor device and a related manufacturing method. Background technique [0002] BCD (Bipolar-CMOS-DMOS) technology is a technology that can combine Bipolar (bipolar transistor), CMOS (Complementary Metal Oxide Semiconductor, complementary metal oxide semiconductor) and DMOS (double-diffusion Metal Oxide Semiconductor, bidirectional diffusion metal oxide semiconductor) Integrated process technology in which devices are simultaneously integrated on a single chip. LDMOS (Lateral Double Diffusion Metal-Oxide-Semiconductor, Lateral Double Diffusion Metal-Oxide-Semiconductor) device is a high-voltage lateral semiconductor device in the BCD process. It is generally used as a driving device for subsequent modules and is the most critical part of modern BCD process design. [0003] In the traditional 0.18μm BCD process with epitaxial modules, the voltage specifications of...

Claims

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Application Information

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IPC IPC(8): H01L29/06H01L21/324
CPCH01L29/0603H01L29/0615H01L29/0684H01L21/324
Inventor 陈斌
Owner JOULWATT TECH INC LTD
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