U-W-N ternary thin film as well as preparation method and application thereof

A U-W-N, thin-film technology, applied in nuclear reactors, fusion reactors, thermonuclear fusion reactors, etc., can solve problems such as limited ability to suppress stimulated Brillouin scattering, complex structural layers of uranium black cavity, and easy excitation of epithermal electrons, etc., to achieve Effects of suppressing M-band hard X-rays and epithermal electron yield, protecting uranium black cavity conversion layer, good interfacial bonding force and chemical compatibility

Active Publication Date: 2020-10-27
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
View PDF12 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the invention is to solve the complex structure of the existing uranium black cavity, the UN x The control range of N content in the descattering/protective layer is limited, the ability to su

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0008] Specific embodiment 1: This embodiment is a UWN ternary film, which is characterized in that the mass fraction of N in the UWN ternary film is x%, and 0

Example Embodiment

[0009] Embodiment 2: This embodiment is a method for preparing a U-W-N ternary film, which is specifically completed as follows: DC reactive magnetron sputtering co-deposition method is adopted, Ar is used as a protective gas, and N 2 As the reaction gas, U target and W target are used for magnetron sputtering deposition by DC power supply to obtain UWN ternary film. The purity of the U target is more than 99%, the purity of the W target is more than 99.99%, and the purity of the Ar Purity>99.9999%, the N 2 The purity of >99.9999%.

Example Embodiment

[0010] Specific embodiment three: the difference between this embodiment and the specific embodiment two is: the specific process of the DC reactive magnetron sputtering co-deposition method is as follows:

[0011] 1. Install 1-9 mandrels on the rotating support table, adjust the distance between U target and the center of the mandrel to be 10cm-20cm, and the center normal of U target and the plane where the mandrel is located are at an angle of 45°; adjust W target and The distance between the center of the mandrel is 10cm~20cm, and the center normal of the W target surface and the plane of the mandrel are at an angle of 45°; U and W targets are symmetrically distributed with the normal of the plane where the mandrel is located;

[0012] 2. Vacuuming by mechanical pump and molecular pump to make the vacuum degree of the deposition chamber reach 1×10 -8 Pa~1×10 -6 Pa, then fill the shielding gas and the reaction gas, the ratio of the gas flow rate of the shielding gas to the gas flo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to view more

Abstract

The invention discloses a U-W-N ternary thin film and a preparation method and application thereof, belongs to the technical field of laser fusion engineering, and particularly relates to a U-W-N ternary thin film with black cavity dispersion reduction and protection effects and a preparation method and application of the U-W-N ternary thin film. The preparation method and application of the U-W-Nternary thin film aim to solve the problems that a structure layer of an existing uranium black cavity is complex, the regulation and control range of the N content in a UN<x> dispersion reduction/protection layer is limited, the stimulated Brillouin scattering inhibition capacity is limited, and M-band hard X rays of an Au protection layer and superheated electrons are prone to exciting. The mass fraction of N in the U-W-N ternary thin film is x%, x is larger than 0 and smaller than or equal to 66.7%, the mass fraction of W is y%, y is larger than 0 and smaller than or equal to 10%, and thebalance U. The preparation method comprises the steps that a direct-current reactive magnetron sputtering co-deposition method is adopted, N2 serves as reaction gas, magnetron sputtering deposition isconducted on a U target and a W target through a direct-current power source, and the U-W-N ternary thin film is obtained. And the U-W-N ternary thin film is applied to the black cavity as a dispersion reduction/protection layer.

Description

technical field [0001] The invention belongs to the technical field of laser fusion engineering, and in particular relates to a U-W-N ternary thin film with black cavity descattering and protective functions, a preparation method and application thereof. Background technique [0002] In order to realize the globally challenging scientific project of indirect laser-driven controlled thermonuclear fusion reaction (ICF), people have been looking for black cavity materials with better comprehensive performance in conversion efficiency and radiation field characteristics. Theoretical analysis and experimental research show that, compared with the traditional Au black cavity, using metal U with higher radiation and opacity as the black cavity wall material can reduce the energy loss by about 17%, and can effectively suppress the M band hard X Rays and epithermal electron yield (O. Jones, J. Schein, M. Rosen, et al. Phys. Plasmas, 2007, 14, 056311). However, due to the active chem...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): C23C14/06C23C14/35G21B1/11
CPCC23C14/0641C23C14/0688C23C14/352C23C14/0036G21B1/11Y02E30/10
Inventor 何智兵易泰民宛悦杜凯郑凤成李宁邢丕峰杨蒙生柯博何小珊王丽熊郭亮
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products