Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Epitaxial wafer of light-emitting diode and preparation method of epitaxial wafer

A technology of light-emitting diodes and epitaxial wafers, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., and can solve problems such as reduced overlap of electron-hole wave functions, reduced radiation recombination efficiency, and tilted quantum well bands.

Active Publication Date: 2021-03-30
HC SEMITEK ZHEJIANG CO LTD
View PDF5 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In related technologies, in the growth of Mini LED epitaxy technology, InGaN / GaN materials are used to make multiple quantum wells. Since the lattice constant of InGaN materials is larger than that of GaN, they are subjected to compressive stress, and the compressive stress increases with the increase of In composition. Severe lattice mismatch will directly affect the intensity of piezoelectric polarization. The polarization electric field will cause the energy band of the quantum well to tilt, making the overlap of the electron-hole wave function smaller, and the defects and dislocations in the bottom layer will extend to the quantum well region. A large number of defects and dislocations will reduce the radiation recombination efficiency, resulting in low luminous efficiency of Mini LED

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Epitaxial wafer of light-emitting diode and preparation method of epitaxial wafer
  • Epitaxial wafer of light-emitting diode and preparation method of epitaxial wafer
  • Epitaxial wafer of light-emitting diode and preparation method of epitaxial wafer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] In order to make the purpose, technical solution and advantages of the present disclosure clearer, the implementation manners of the present disclosure will be further described in detail below in conjunction with the accompanying drawings.

[0027] figure 1 It is a schematic structural diagram of an epitaxial wafer of a light emitting diode provided by an embodiment of the present disclosure. Such as figure 1 As shown, the epitaxial wafer includes a substrate 10 and an AlN buffer layer 20, a three-dimensional nucleation layer 30, a u-type GaN layer 40, an n-type GaN layer 50, a multi-quantum well layer 60, and a low-temperature p type layer 70, electron blocking layer 80 and high temperature p-type layer 90.

[0028] Wherein, the multi-quantum well layer 60 includes a plurality of In x Ga 1-x N quantum well layer 61 and a plurality of GaN quantum barrier layers 62, and the In x Ga 1-x A composite structure 63 between the N quantum well layer 61 and the GaN quantu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Doping concentrationaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides an epitaxial wafer of a light emitting diode and a preparation method of epitaxial wafer, and belongs to the technical field of photoelectron manufacturing. The epitaxial wafercomprises a substrate, an AlN buffer layer, a three-dimensional nucleating layer, a u-type GaN layer, an n-type GaN layer, a multi-quantum well layer, a low-temperature p-type layer, an electron blocking layer and a high-temperature p-type layer, the multi-quantum well layer comprises a plurality of InxGa1-xN quantum well layers, a plurality of GaN quantum barrier layers and a composite structurelocated between the InxGa1-xN quantum well layers, and the composite structure comprises a n-InyGa1-yN layer and a SiN layer. Si atoms in the n-In-yGa1-yN layer can fill defect vacancies in the InGaNmaterial, the InGaN material with a low In component is beneficial to weakening a polarization electric field and improving energy band inclination, and the SiN layer is beneficial to uniform diffusion of carriers in the multi-quantum well layer, improving the carrier localization effect and improving the luminous efficiency of the LED.

Description

technical field [0001] The disclosure relates to the technical field of optoelectronic manufacturing, in particular to an epitaxial wafer of a light emitting diode and a preparation method thereof. Background technique [0002] LED (Light Emitting Diode, light-emitting diode) has the advantages of small size, long life, low power consumption, etc., and is currently widely used in automobile signal lights, traffic lights, display screens and lighting equipment, especially for the resolution and display quality of display devices. The requirements are getting higher and higher, and the application of Mini LEDs is also increasing. [0003] At present, GaN-based LED epitaxial wafers usually include a substrate and an AlN buffer layer, a three-dimensional nucleation layer, a u-type GaN layer, an n-type GaN layer, a multi-quantum well layer and a p-type layer grown sequentially on the substrate. After the LED is energized, carriers (including electrons in the n-type GaN layer and...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L33/06H01L33/12H01L33/14H01L33/00
CPCH01L33/06H01L33/12H01L33/14H01L33/145H01L33/0075H01L33/007
Inventor 洪威威尚玉平梅劲董彬忠
Owner HC SEMITEK ZHEJIANG CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products