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Method for evaluating aging of photovoltaic insulating backboard based on total discharge energy method

A photovoltaic backplane and total energy technology, applied in the monitoring of photovoltaic systems, photovoltaic power generation, photovoltaic modules, etc.

Pending Publication Date: 2021-04-30
XIAN UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] At present, there are no relevant reports and studies on the aging evaluation of photovoltaic backplanes caused by discharge.

Method used

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  • Method for evaluating aging of photovoltaic insulating backboard based on total discharge energy method
  • Method for evaluating aging of photovoltaic insulating backboard based on total discharge energy method
  • Method for evaluating aging of photovoltaic insulating backboard based on total discharge energy method

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0068] The present invention is based on the discharge energy to evaluate the life of the photovoltaic backplane under electrical aging conditions: AC controllable power supply, step-up transformer, high voltage differential probe, high frequency current transformer, coupling capacitor, low pass filter, oscilloscope, computer.

[0069] Step 1: Preliminary preparation

[0070] Sample preparation

[0071] (1) Sample handling

[0072] Clean the photovoltaic backplane sample of appropriate size with anhydrous alcohol, then air-dry it with an ion air dryer or air-dry it naturally, and then place the processed sample under the copper electrode of the partial discharge experiment platform.

[0073] (2) Discharge time selection

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PUM

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Abstract

The invention discloses a method for evaluating aging of a photovoltaic insulating backboard based on a total discharge energy method. The method specifically comprises the following steps: S1, constructing a calculation model of total discharge energy and charge penetration depth; S2, constructing a function model of the charge penetration depth with respect to the service life of a photovoltaic backboard; S3, according to the models constructed in the S1 and the S2, establishing a function model of the total discharge energy and the backboard service life; and S4, performing a partial discharge experiment on the aged photovoltaic back plate, calculating energy released by the photovoltaic backboard during discharge, and substituting the energy into the function model established in the step S3 to evaluate the service life of the photovoltaic backboard. The evaluation method is based on the total discharge energy, evaluates the service life of the photovoltaic backboard under different electrical aging degree conditions by using a mathematical model between the aging time of the backboard and the total discharge energy when the photovoltaic backboard discharges, and has the characteristics of high accuracy, short test time and simple experiment.

Description

technical field [0001] The invention relates to a method for evaluating the aging of a photovoltaic insulating backplane, in particular to a method for evaluating the aging of a photovoltaic insulating backplane based on a discharge total energy method. Background technique [0002] As a clean and renewable energy source, solar energy is gradually recognized by the world, and its structure mainly includes battery sheets, adhesive films, glass, and backplanes. The photovoltaic backsheet is the outermost protection of the entire photovoltaic system, requiring excellent heat resistance, weather resistance, waterproof performance, UV resistance, insulation and aging resistance, which are crucial to the power generation efficiency of the photovoltaic system. However, during the actual operation of the solar power generation system, due to the influence of partial discharge, temperature, humidity, ultraviolet radiation and various chemical erosions, the insulating backplane will b...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/12G01R31/00H02S50/10G06F30/20G06F17/15G06F111/10G06F119/04
CPCG01R31/1263G01R31/003H02S50/10G06F30/20G06F17/15G06F2111/10G06F2119/04Y02E10/50
Inventor 张嘉伟徐藩李天浩张泽磊
Owner XIAN UNIV OF TECH
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