Method for growing indium phosphide single crystal by VGF method

A technology of indium phosphide and single crystal, which is applied in the field of indium phosphide single crystal preparation, can solve the uneven distribution of carrier concentration and electron mobility, which affects the application life and cost of high-power microwave devices, and indium phosphide single crystal Low pass rate and other problems, to achieve the effect of adding automatic temperature control and temperature adjustment function, uniform resistivity distribution ratio, and stable vertical oriented crystallization

Active Publication Date: 2021-11-12
YUNNAN XINYAO SEMICON MATERIAL CO LTD
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the pass rate of indium phosphide single crystal obtained by traditional VGF growth is low, and the diameter is mainly 2" and a small amount of 3", which is difficult to meet the needs of the application market.
Although the indium phosphide single crystal grown by LEC has a high crystallization rate, it is affected by high dislocations, uneven distribution of carrier concentration and electron mobility, which indirectly affects the application life and cost of high-power microwave devices.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for growing indium phosphide single crystal by VGF method
  • Method for growing indium phosphide single crystal by VGF method
  • Method for growing indium phosphide single crystal by VGF method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] The process of indium phosphide single crystal growth: material preparation→furnace preparation→furnace installation→heating molten material→melt seed→growth→cooling annealing→out of furnace and demoulding;

[0030] 1. Preparation of materials: In a 100-level environment, the seed crystal, diboron trioxide (water content less than 200PPm), high-purity red phosphorus (5N), dopant (5N diindium trisulfide or 5N high-purity iron), and polycrystalline materials are sequentially prepared (mobility > 2000Cm2 / V.S) into the cleaned PBN crucible, covered with a quartz cap, loaded into a quartz material tube, and vacuumed, followed by hydrogen-oxygen flame sealing welding for use. Note: PBN crucible must be annealed with oxygen at high temperature (1200°).

[0031] 2. Furnace preparation, specifically as Figure 4 Shown:

[0032] 2.1 Install quartz material tube 8, quartz furnace tube 7, heating layer 6 and other conventional structures between PBN crucible 10 and high-pressure ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
purityaaaaaaaaaa
Login to view more

Abstract

The invention belongs to the field of preparation of indium phosphide single crystals, and particularly discloses a method for growing indium phosphide single crystal by a VGF method. The method comprises the steps of putting raw materials into a crucible and assembling a single crystal growth furnace by adopting the VGF method, and carrying out high-temperature annealing treatment; raising the temperature of the melt, and setting a heating target value in a heating control program for heating and pressurizing; carrying out seed melting growth, setting a growth temperature, when the melting length of the seed crystal reaches 10-15mm and the rotating shoulder growth is carried out, enabling the position of the crucible to begin to descend with the descending speed being not greater than 2.5 mm / h, and automatically stopping the descending of the crucible position after the growth is finished; and conducting cooling and annealing, specifically, automatically conducting cooling and annealing after growth is finished, emptying air pressure in the furnace after the temperature is reduced to 350 DEG C, opening a furnace door after the temperature in the furnace is reduced to about 150 DEG C, and obtaining the single crystal. According to the invention, the pulling speed method is added, so that the thermal field of the indium phosphide single crystal in the growth process is more uniform, vertical orientation crystallization is more stable, more indium phosphide single crystals grow, and the qualified rate of the crystal is higher.

Description

technical field [0001] The invention belongs to the field of indium phosphide single crystal preparation, and in particular relates to a method for growing indium phosphide single crystal by a VGF method. Background technique [0002] Indium phosphide single crystal is an important second-generation compound Ⅲ-Ⅴ semiconductor crystal after germanium crystal and gallium arsenide crystal. It is mainly used in the fields of optoelectronic technology, microwave technology and space satellite communication. The preparation process of high-quality indium phosphide single crystal materials has higher requirements and is more difficult. Because indium phosphide single crystal whiskers can only be prepared under high temperature and high pressure, and the stacking fault energy of indium phosphide is low, it is easy to produce twins, so large-sized, high-quality indium phosphide single crystals are difficult to prepare. The growth methods of indium phosphide single crystal mainly inc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C30B29/40C30B11/00
CPCC30B29/40C30B11/00C30B11/006
Inventor 包文瑧柳廷龙赵兴凯普世坤何永彬叶晓达祝永成权忠朝
Owner YUNNAN XINYAO SEMICON MATERIAL CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products