Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

High-precision reference generation method and system

A production method and high-precision technology, which is applied in the direction of control/regulation system, instrument, and electric variable adjustment, to achieve high precision, low load regulation rate, and wide application prospects

Active Publication Date: 2022-01-07
西安华芯微半导体有限公司
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] However, due to the nonlinear effects of semiconductor design and manufacturing, no matter how complicated the compensation is, similar patents cannot completely solve the problems caused by power fluctuations, temperature changes, and load changes.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-precision reference generation method and system
  • High-precision reference generation method and system
  • High-precision reference generation method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0052] see figure 1 , figure 2 , image 3 , Figure 4 , Figure 5a , Figure 5b , Figure 6a , Figure 6b , Figure 7 , Figure 10 , which looks like this:

[0053] The high-precision reference source in this embodiment includes: an internally set conventional reference source, internal control variable sampling, digital calibration interface, digital calibration processing, calibration data and a compensation controller.

[0054] General reference source set internally. Divided into voltage-controlled current source, current-controlled current source, voltage-controlled voltage source, current-controlled voltage source, see figure 2 . The analog reference can be composed of triode, Zener tube, MOS, and corresponding peripheral resistors. The digital reference can be directly generated by D / A conversion, please refer to Figure 4 . By setting the current and voltage control source internally, the output circuit and voltage source can be adjusted. The internal ...

Embodiment 2

[0063] The digital calibration interface adopts the SPI interface, which is responsible for receiving digital signals from the temperature sensing part, the voltage measurement part at the load, the current measurement part at the load, and the power supply voltage measurement part, and sending them to the compensation controller. For the temperature and current sampling circuit, please refer to Figure 8 shown. The external calibration interface is an analog interface, which is not limited by the working conditions of the chip.

[0064] The compensation controller includes a central processing unit CPU with data processing capabilities, data memory RAM, program memory ROM, various I / O ports and interrupt systems, timers / counters, the compensation controller collects communication traffic from the digital calibration interface, and performs Decoding analysis, calculate the actual temperature value, load voltage value, load current value and power supply voltage value in the co...

Embodiment 3

[0071] see Figure 13 , Figure 13 A schematic diagram of a high-precision reference generation system module provided by the embodiment of the present invention is as follows:

[0072] The high-precision reference source module 10 is used to adjust the internal reference source and / or bias source according to the method of the digital circuit, so as to realize the high-precision reference or bias, internally set internal control variable sampling, digital calibration interface, and digital calibration processor , data memory, compensation controller, digital calibration processing;

[0073] Adding the calibration signal module 20 of the analog reference, which is used to externally add the calibration signal of the analog reference to the digital calibration interface, so as to realize the high-precision reference or offset under the required working conditions;

[0074] The calibration and compensation module 30 is used to correct the internal reference under various worki...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a high-precision reference generation method and system, and relates to the field of semiconductor chips. The high-precision reference generation method comprises the steps that: an internal reference source and / or a bias source are / is adjusted according to a digital circuit method so as to achieve the high-precision reference or bias, and internal control variable sampling, a digital calibration interface, a digital calibration processor, a data storage device, a compensation controller and digital calibration processing are arranged inside; a calibration signal of an analog reference is added to the outside in the digital calibration interface, so that the digital calibration interface realizes high-precision reference or bias under various required working conditions; and when in a calibration state, the internal reference is corrected through the external high-precision reference under various working conditions, and when in a normal working condition, the interior is compensated in real time through digital processing, so that the high-precision reference or bias is achieved. In addition, the invention also provides a high-precision reference generation system.

Description

technical field [0001] The invention relates to the field of semiconductor chips, in particular to a method and system for generating a high-precision reference. Background technique [0002] As the basic modules of analog or hybrid circuits, the main function of the reference voltage and current source is to provide a stable bias for the circuit, so the performance of the reference voltage and current source will directly affect the accuracy and performance of the entire circuit system. With the continuous expansion of the scale of integrated circuits and the widespread application of portable electronic systems, while the reference circuit is widely used, it also puts forward higher requirements for its performance. [0003] Affected by power supply, temperature, load, and different working conditions, the reference source varies greatly. The power supply rejection ratio characteristic is an important indicator of the reference source in the application of high frequency ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G05F1/567
CPCG05F1/567
Inventor 李力生
Owner 西安华芯微半导体有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products