Epitaxial wafer, epitaxial wafer preparation method and light emitting diode
An epitaxial wafer and quantum technology, applied in the semiconductor field, can solve the problem of low carrier mobility, achieve the effect of improving mobility and reducing the average C impurity concentration
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Embodiment 1
[0037] see Figure 1 to Figure 3 , shows the epitaxial wafer proposed in the first embodiment of the present invention, and the epitaxial wafer includes:
[0038]Substrate 10, buffer layer 20 epitaxially grown on the substrate in sequence, undoped AlGaN layer 30, N-type doped AlGaN layer 40, multiple quantum well layer 50, electron blocking layer 60, P-type doped GaN layer 70 and the contact layer 80 .
[0039] Preferably, in this embodiment, the buffer layer 20 is an AlN layer, and the contact layer 80 is an AlGaN layer.
[0040] The multiple quantum well layer includes quantum well layers and quantum barrier layers that are alternately stacked periodically, wherein the number of periods can be set according to the actual situation, which is not limited here. figure 1 As shown, the number of periods is 2. Specifically, the quantum well layer 51 includes a first quantum well sublayer 510, a second quantum well sublayer 511 and a third quantum well sublayer 512 that are stack...
Embodiment 2
[0046] see Figure 4 , is the epitaxial wafer preparation method proposed in the second embodiment of the present invention, the epitaxial wafer preparation method is used to prepare the epitaxial wafer proposed in the above-mentioned first embodiment, and the epitaxial wafer preparation method includes steps S10 to S13 .
[0047] Step S10, providing a substrate.
[0048] Specifically, in this embodiment, the substrate is a sapphire substrate.
[0049] In step S11, a buffer layer, an undoped AlGaN layer, and an N-type doped AlGaN layer are sequentially epitaxially grown on the substrate.
[0050] Specifically, PVD is used to grow the buffer layer on the substrate, wherein the growth temperature is 400-650°C, the sputtering power is 2000-4000W, the growth pressure is 1-10torr, and the growth thickness is 15-50nm; the buffer layer is in MOCVD In-situ annealing treatment is performed in a hydrogen atmosphere, the annealing temperature is 1000°C-1200°C, the annealing pressure is...
Embodiment 3
[0059] The light emitting diode proposed in the third embodiment of the present invention includes the epitaxial wafer in the above-mentioned first embodiment, and the epitaxial wafer is prepared by the method for preparing an epitaxial wafer in the above-mentioned second embodiment.
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