Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for judging sub-crystal domain and crystal lattice direction of rhenium compound film based on optical method

A compound and lattice orientation technology, which is applied in the direction of material analysis, scientific instruments, and instruments through optical means, can solve the problems of high equipment requirements, decreased electrical mobility, and obstacles to large-scale device applications, and meet the requirements of equipment conditions The effect of low cost and simple operation process

Pending Publication Date: 2022-08-09
XIDIAN UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The generation of grain boundaries will significantly reduce the electrical mobility of rhenium disulfide samples or other rhenium compounds and hinder their large-scale device application. case orientation is necessary
However, the prior art requires the use of polarized Raman spectroscopy and transmission electron microscopy when judging, which requires high equipment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for judging sub-crystal domain and crystal lattice direction of rhenium compound film based on optical method
  • Method for judging sub-crystal domain and crystal lattice direction of rhenium compound film based on optical method
  • Method for judging sub-crystal domain and crystal lattice direction of rhenium compound film based on optical method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] In this example, an optical microscope is used to determine the sub-domains and grain boundaries of the rhenium disulfide thin film, and the optical path diagram of the experimental device used is as follows figure 1shown.

[0036] A freely insertable external polarizer is placed in the collecting light path of the optical microscope, and the polarizing direction of the polarizer is the x direction, which will be transferred to 300nm thick SiO 2 / The rhenium disulfide sample on the Si substrate is placed on the stage of the optical microscope, the sample stage is rotated every 20°, and the photo is taken. The obtained sample photos under different rotation angles are as follows: image 3 It can be seen that with the change of the rotation angle of the sample, different regions show obvious contrast differences. According to the contrast differences, we can divide the trapezoidal rhenium disulfide sample into three regions, such as Figure 4 As shown, they are represen...

Embodiment 2

[0039] The rhenium disulfide used in this example is few-layer ReS grown at 800°C 2 .

[0040] A freely insertable external polarizer is placed in the collecting light path of the optical microscope, and the polarizing direction of the polarizer is the x direction, which will be transferred to 300nm thick SiO 2 The rhenium disulfide sample on the / Si substrate was placed on the stage of the optical microscope, the sample stage was rotated every 20°, and photographs were taken.

[0041] RGB contrast extraction was performed on the photographed photos to obtain the lattice orientation of each subdomain.

[0042] Figure 8 Few-layer ReS grown at 800°C 2 Photographs under a polarized light microscope and periodograms of B channel changes in the corresponding regions. Figure 8 (a) is an optical micrograph at a rotation of 40°, which can be divided into two regions according to the contrast difference, respectively using and represents, and plots the relative contrast of th...

Embodiment 3

[0044] The rhenium disulfide used in this example is a thick layer of ReS grown at 900°C 2 .

[0045] A freely insertable external polarizer is placed in the collecting light path of the optical microscope, and the polarizing direction of the polarizer is the x direction, which will be transferred to 300nm thick SiO 2 The rhenium disulfide sample on the / Si substrate was placed on the stage of the optical microscope, the sample stage was rotated every 20°, and photographs were taken.

[0046] RGB contrast extraction was performed on the photographed photos to obtain the lattice orientation of each subdomain.

[0047] Figure 9 Few-layer ReS grown at 900°C 2 Photographs under a polarized light microscope and periodograms of B channel changes in the corresponding regions. Figure 9 (a) is an optical micrograph at a rotation of 40°, which can be divided into two regions according to the contrast difference, respectively using and represents, and plots the relative contras...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Lengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses a method for judging the sub-domain and lattice direction of a rhenium compound film based on an optical method, and belongs to the technical field of two-dimensional nano material characterization. The method comprises the following steps: placing a rhenium-family compound film sample on an objective table of an optical microscope containing polarized light, rotating the position of the rhenium-family compound film sample, photographing the rotated sample, and judging all sub-domains and crystal boundaries of the rhenium-family compound film sample; rGB contrast extraction is carried out on a photo obtained through photographing, and the lattice orientation of each sub-domain is obtained. The method disclosed by the invention is relatively low in equipment condition requirement and simple in operation process, and is a lossless, rapid and convenient method for distinguishing and judging the rhenium sulfide crystal boundary and identifying the lattice orientation of each sub-domain.

Description

technical field [0001] The invention relates to the technical field of characterization of two-dimensional nanomaterials, and more particularly to a method for judging sub-domains and lattice directions of rhenium compound thin films based on an optical method. Background technique [0002] The excellent optical, electrical, thermal and mechanical properties of two-dimensional atomic crystal materials make them have broad application prospects in the fields of electronics, optoelectronics, energy storage devices and catalysis in the future, and have quickly become a research hotspot in the field of materials. Such as rhenium group compounds, among which, the anisotropic two-dimensional material rhenium disulfide (ReS 2 ) is a "new star" in the family of 2D materials in recent years. ReS 2 The unique lattice structure endows it with many extraordinary properties, and density functional theory calculations show that the single-layer ReS 2 For the twisted 1T phase, this part...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/84
CPCG01N21/84G01N2021/8477
Inventor 李晓波张建斌周楠杨如森
Owner XIDIAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com