Method and equipment for raising speed of electronic cyclotron resonance chemical vapor deposition
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BEIJING UNIV OF TECH
- Publication Date
- 2003-05-14
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] A method and device for increasing the speed of electron cyclotron resonance chemical vapor deposition belong to the technical field of microwave low-temperature plasma. Background technique
[0002] High-speed deposition of thin films is an important development direction for microwave plasma applications. Electron cyclotron resonance (ECR) plasma is a new type of microwave plasma developed in the past ten years. Due to its high degree of ionization and no electrode pollution, it has been paid more and more attention by people. However, there are still some problems in controlling the axial magnetic field configuration of electron cyclotron resonance plasma in the prior art, resulting in the electron cyclotron resonance CVD thin film deposition rate hovering at a low level.
[0003] The configuration of the axial magnetic field in the vacuum deposition chamber plays a crucial role in controlling the shape of the plasma and the deposition rate of the...