Acoustooptic frequency modulation single exposure imaging interference photo-etching method and system thereof
An imaging interference and lithography system technology, which is applied in the field of acousto-optic frequency modulation single-exposure imaging interference lithography method and its system, can solve the problem of reducing the modulation transfer function of high-frequency components, reducing image contrast and resolution, and difficult to align three exposures. and other problems, to achieve the effect of reducing alignment difficulties, reducing process complexity, and reducing the number of exposures
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0014] Such as figure 1 As shown, the acousto-optic frequency modulation imaging interference lithography system of the present invention includes a laser 1, a three-beam beam splitter 2, a variable density attenuation filter 3, an acousto-optic frequency modulator 4, a beam expansion collimation spatial filter 5, a reflector Mirror 6, movable mirror 7, photomask 8, zero-order attenuation filter 9, imaging system 10, movable mirror 11, resist silicon wafer 12, the laser light emitted by laser 1 passes through three beam splitters 2 Divide into three beams of light ①, ② and ③ with a certain angle and approximately equal intensity. After the three beams pass through three variable density attenuation filters respectively, the beam ① passes through the beam expander collimation spatial filter 5 and becomes parallel light Vertically illuminate the photomask 8, and the light beams ② and ③ are changed into light with wavelengths of λ+Δλ and λ-Δλ through the acousto-optic frequency ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com