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Base board detector and glass base board detector

A substrate inspection and inspection equipment technology, applied in semiconductor/solid-state device testing/measurement, measurement devices, optical testing flaws/defects, etc., can solve problems such as increasing the time and equipment cost of transporting glass substrates, and being unable to monitor and control production quality in real time.

Inactive Publication Date: 2007-06-27
AU OPTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, no matter whether it is transported to the inspection station by a robot arm or another conveyor line, it will increase the time for transporting the glass substrate and the equipment cost of adding a conveyor line, and it is impossible to monitor and control the production quality in real time
In addition, as the size of glass substrates tends to become larger and thinner, how to effectively maintain a certain quality of manufacturing yield and production efficiency; especially, when the demand for glass substrates increases, the quality of products can be monitored in real time Without affecting production capacity, it will be a severe challenge for panel manufacturers

Method used

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  • Base board detector and glass base board detector
  • Base board detector and glass base board detector
  • Base board detector and glass base board detector

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Embodiment Construction

[0034] The invention provides a detection device applicable to various substrates. However, in a preferred embodiment, the present invention is mainly applicable to the inspection of glass substrates, especially the inspection of glass substrates processed by color filters (Color Filter, CF). The invention has the advantages of online real-time detection and monitoring of the pass rate of the substrate and mass production. The above-mentioned color filter is mainly used in flat-panel displays such as TFT-LCD, PDP or EL. However, in different embodiments, the substrate can also be applied in semiconductor, chemical industry, traditional industry or other different fields. Below promptly coordinate accompanying drawing, further illustrate each specific embodiment of the present invention and steps thereof:

[0035] Fig. 2 and Fig. 3 are schematic diagrams of embodiments of the lifting mechanism of the present invention. The substrate inspection apparatus 100 of the present in...

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Abstract

The check out test set is assorted to conveying appliance to be used. Possessing transportation face, the conveying appliance is in use for transporting at least one base plate. The check out test set for base plate includes the supporting seat, the uplift mechanism, the light box, and the drive mechanism. The uplift mechanism is setup on the supporting seat. The uplift mechanism possesses multiple pieces of uplift brackets. Being positioned under transporting face, each uplift bracket setup is parallel to the transporting face. Being setup corresponding to the uplift mechanism, the light box is in use for visual inspecting glass base plate. The drive mechanism setup inside the supporting seat is connected to the uplift mechanism.

Description

technical field [0001] The invention relates to a substrate detection device; in particular, the invention relates to a glass substrate detection device for online detection. Background technique [0002] Glass substrates generally used in the manufacture of display devices such as liquid crystal displays (TFT-LCD), plasma displays (PDP, Plasma Display Panel) or electroluminescent components (EL, Electroluminescence) are melted and molded into flat glass substrates through a glass melting furnace. After being manufactured in a one-time cutting process according to specifications, it continues to be transported and processed on the processing line. Next, on the glass substrate processing line, the glass substrate is cut into sizes that meet the specifications of each flat-panel display, and the four sharp edges formed by cutting are ground and cut at the four corners (Comer cut) anchor mark. [0003] During a series of operations such as forming, cutting, grinding, and hand...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/896G01N21/89H01L21/66
Inventor 魏仲立郭永仁
Owner AU OPTRONICS CORP
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