Projection electron beam apparatus and defect inspection system using the apparatus
a technology of electron beam and projection electron beam, which is applied in the direction of magnetic discharge control, instruments, therapy, etc., can solve the problems of axial chromatic aberration, axial chromatic aberration increase, and discharge between a sample and the lens
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[0289]Indicated Direction: Right . . . Stage Moving Direction: Left (an image moves to the left=the field of view moves to the right)
[0290]Indicated Direction: Upward . . . Stage Moving Direction: Downward (an image moves downward=the field of view moves upward)
(2) Direct Entry of Coordinates on GUI:
[0291]Coordinates directly entered on the GUI are regarded as a location at which the operator wishes to view on the wafer coordinate system, so that the stage is moved such that the coordinate on a wafer are displayed at the center of a captured image.
[0292]In the apparatus described in connection with FIG. 14, a procedure is taken to mount a correction ring on the electrostatic chuck, and position a wafer such that the wafer fits in the inner diameter of the correction ring. Therefore, in the inspection apparatus illustrated in FIG. 15, a procedure is taken to mount a correction ring on a wafer in the load lock chamber 22•1, integrally transfer the wafer mounted with the correction rin...
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