The invention relates to a wide-field
microscope and to a method for determining
spatially resolved height information of a sample (14) by means of a wide-field
microscope. The wide-field
microscope comprises an illumination source (1, 52, 53), which is arranged in an illumination beam path; a first
detector unit (17, 33) for capturing a wide-field image in an observation beam path of a sample (14) illuminated in a
sample plane (P); a modulator for chromatically modulating the illumination beam path or the observation beam path in a direction perpendicular to the
sample plane (P); an evaluating unit for determining chromatic
confocal height information in each pixel of the wide-field image. The method comprises the following steps: illuminating the sample (14) by means of a wide-band illumination source (1) in an illumination beam path; chromatically modulating the illumination beam path or a detection beam path; capturing at least one wide-field image from sample light reflected or emitted by the sample in the detection beam path, said sample light having chromatic
confocal components; determining, pixel by pixel, height information of the sample from the wide-field image by evaluating chromatic
confocal components of the detection beam path in accordance with the chromatic modulation.