Method for manufacturing nanocrystalline thin-film device for ultraviolet detecting
A technology for ultraviolet detectors and thin-film devices, which is applied in the manufacture of semiconductor devices, electrical components, and final products. low effect
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Embodiment 1
[0020] Dissolving ZnO nanocrystals in chloroform solvent to prepare a nanocrystal solution with a concentration of 50 mg / ml. The ZnO nanocrystal solution was spin-coated on the cleaned glass substrate by a spin-coating method to form a uniform film with a thickness of 100 nm. After annealing at 250°C for 20 minutes in air, a pair of T-shaped Ag electrodes with a spacing of 240 μm, a length of 3 mm, and a thickness of 60 nm were evaporated on the surface of the nanocrystalline film to prepare a nanocrystalline film device for ultraviolet detection. . For the test results of the device see figure 1 , with the following characteristics:
[0021] A. The dark current is extremely low, and the resistance at room temperature exceeds 1T (10 12 )Ω.
[0022] B. No response to light with a wavelength exceeding 400nm, that is, in the visible / infrared region.
[0023] C. The ultraviolet light guide has high sensitivity, at an intensity of 0.83mW / cm 2 Under the irradiation of 370nm ul...
Embodiment 2
[0028] The Mg-doped ZnO nanocrystals were dissolved in tetrahydrofuran solvent to prepare a nanocrystal solution with a concentration of 2 mg / ml. The ZnO nanocrystal solution was spin-coated on the cleaned SiO surface by spin coating method. 2 / Si substrate, a uniform thin film with a thickness of 10 nm was formed. After annealing at 350°C for 10 minutes in air, a pair of T-shaped Au electrodes with a distance of 240 μm, a length of 3 mm, and a thickness of 30 nm were evaporated on the surface of the nanocrystalline film to prepare a nanocrystalline film device for ultraviolet detection. .
Embodiment 3
[0030] Al-doped ZnO nanocrystals were dissolved in chloroform solvent to prepare a nanocrystal solution with a concentration of 100 mg / ml. The ZnO nanocrystal solution was spin-coated on the cleaned Si substrate by a spin-coating method to form a uniform film with a thickness of 200 nm. After annealing at 250°C for 30 minutes in air, a pair of T-shaped Cu electrodes with a distance of 240 μm, a length of 3 mm, and a thickness of 60 nm were evaporated on the surface of the nanocrystalline film to obtain a prototype of the ultraviolet detector. Nanocrystalline thin film devices used in ultraviolet detectors were prepared.
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