Detection circuit for auto detecting avalanche magnitude of voltage of avalanche photodiode and method

An avalanche photoelectric and automatic test technology, which is applied in the direction of measuring current/voltage, measuring electrical variables, testing a single semiconductor device, etc., can solve problems such as low efficiency, easy burning of avalanche photodiodes, and material waste, so as to improve efficiency and reduce fine-tuning steps, the effect of reducing the difficulty of operation

Inactive Publication Date: 2009-03-18
SUPERXON (CHENGDU) TECH LTD
View PDF0 Cites 38 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the method is manual operation, the efficiency is low. Even for skilled workers, the process usually takes about one minu

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Detection circuit for auto detecting avalanche magnitude of voltage of avalanche photodiode and method
  • Detection circuit for auto detecting avalanche magnitude of voltage of avalanche photodiode and method
  • Detection circuit for auto detecting avalanche magnitude of voltage of avalanche photodiode and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] refer to figure 1 , automatic test avalanche photodiode avalanche voltage measurement circuit, mainly composed of boost power chip LT3482 with current monitor and boost controller, microcontroller with high-precision analog monitoring circuit, resistance-capacitance network and peripheral circuits . Wherein, the microcontroller for adjusting and sampling the bias voltage value of the avalanche photodiode and the current value flowing through the avalanche photodiode can be connected to the communication port of the upper microcomputer system through a communication cable. The boost power supply chip has a current monitor and a boost controller inside, combined with a resistance-capacitance network and a microcontroller, it outputs an adjustable boost power supply and monitors the current. The whole circuit is powered by a single 3.3V ~ 5V DC power supply. A decoupling capacitor C that suppresses power supply ripple is connected to the ground at the power input termina...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a test circuit for automatically testing the avalanche voltage of avalanche photodiodes and a method. The test circuit comprises a boost power chip with a current detector and a boost controller for providing bias voltage and current for an avalanche photodiode; a microcontroller with three internal analogue converters for adjusting and sampling the bias voltage and current; four resistance capacitance networks for connecting the internal circuits between the microcontroller and the boost power chip. The three analogue converters of the microcontroller are respectively connected with the feedback input of the boost controller, the bias voltage input of the current detector and the monitor output of the current detector via three resistance capacitance networks. The invention is based on automatic control theory, can automatically adjust safe bias voltage, can judge the avalanche breakdown region by comparing the sampled current value and a preset respected value, and can display the result on a man-machine interface of a microcomputer system, having wide dynamic range, accurate and adjustable output, fast and accurate measurement.

Description

technical field [0001] The present invention relates to an avalanche photodiode (Avalanche Photo Diode, hereinafter referred to as APD) widely used in optical fiber communication network, optical fiber sensing, laser ranging and other photoelectric conversion data processing systems. More specifically, the present invention provides a circuit and method for safely, accurately and quickly measuring the avalanche voltage value of an avalanche photodiode based on successive approximation algorithm and automatic control principle. Background technique [0002] Avalanche photodiode is a semiconductor light detector with small size, high sensitivity and fast speed. Since the gain of an avalanche photodiode has a great relationship with the reverse bias voltage and temperature, it is necessary to control the reverse bias voltage to keep the gain stable. It can be seen that in order to make the avalanche photodiode work in the best state, it is necessary to set an appropriate bias ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R19/00G01R31/26
Inventor 姜先刚邹渊蒋小青
Owner SUPERXON (CHENGDU) TECH LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products