SOI three-dimensional CMOS integrated component and preparation method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XIDIAN UNIV
- Publication Date
- 2009-04-15
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of semiconductor integrated circuits, in particular to a silicon-on-insulator SOI three-dimensional CMOS integrated device and a manufacturing method thereof. Background technique
[0002] Integrated circuits follow Moore's law, and the feature size continues to decrease, and the integration and performance of chips continue to improve. Entering the deep submicron era, the interconnection of devices inside the chip becomes more and more complex. Therefore, the influence of the delay time caused by the parasitic resistance and parasitic capacitance of the interconnection on the performance of the circuit becomes more and more prominent. Studies have shown that after the feature size of the device is less than 250nm, the R-C delay caused by conventional metal wiring will dominate the delay of the entire circuit, which restricts the continuous improvement of the integration and performance of VLSI. The use of...