Method for preparing environmentally stable silicon dioxide porous membrane with ultra-low dielectric constant
A technology of ultra-low dielectric constant and porous film, which is applied in the manufacture of circuits, electrical components, semiconductors/solid-state devices, etc., can solve the problems of complex preparation process of porous films and easy to be affected by the sol process, and achieve good dielectric properties. Constant stability, clear graphics, and the effect of reducing the dielectric constant
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[0013] 1) Preparation of SiO by base catalysis 2 Sol, with PVA as the organic template, in proportion to SiO 2 The sol is mixed and stirred, and SiO is synthesized at 60-100°C 2 / PVA sol;
[0014] 2) SiO 2 / PVA sol was spin-coated on silicon wafers sputtered with platinum electrodes to form wet SiO 2 / PVA film;
[0015] 3) For SiO 2 / PVA wet film undergoes rapid heat treatment at 450-900°C to transform it into amorphous inorganic SiO 2 Porous film;
[0016] 4) This amorphous inorganic SiO 2 The porous film is baked at about 150°C for 1 hour to remove physically adsorbed water;
[0017] 5) Prepare trimethylchlorosilane modification solutions with different volume ratios, which are composed of n-hexane and 5%, 10%, 15%, 20%, 30%, 40%, 50%, 60%, 70% and 80% by volume of trimethylchlorosilane;
[0018] 6) SiO in 4) 2 The porous film is immersed in the above solution for 1-24 hours respectively, and the solution is constantly stirred during this period to continuously up...
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