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Manufacturing method of SOI base three-dimensional wedgy coupler integrated substrate structure

A technology of substrate structure and coupler, which is applied in the field of optoelectronics, can solve the problems affecting the coupling efficiency of coupling devices, the scattering loss cannot be ignored, and the thickness difference of three-dimensional couplers, etc., to achieve good surface quality, strong controllability, and improve coupling efficiency Effect

Inactive Publication Date: 2011-04-20
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI +1
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Problems solved by technology

[0005] Due to the thickness difference between the output waveguide and the input waveguide of the three-dimensional coupler, in the currently applied preparation method, the output waveguide and the three-dimensional coupler area are all realized by dry etching process, and the surface quality is poor, and the scattering caused by the rough surface The loss cannot be ignored, which seriously affects the coupling efficiency of the coupling device

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  • Manufacturing method of SOI base three-dimensional wedgy coupler integrated substrate structure
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  • Manufacturing method of SOI base three-dimensional wedgy coupler integrated substrate structure

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Embodiment Construction

[0028] In order to make the purpose, technical solutions and advantages of the present invention clearer, to further clarify the substantive features and significant progress of the present invention. The present invention will be further described in detail below in conjunction with the accompanying drawings.

[0029] figure 2 Shown is the flow chart of the method for preparing the SOI-based three-dimensional wedge coupler integrated substrate structure provided by the present invention. Such as figure 2 As shown, the preparation method includes the following steps:

[0030] Step one, select two pieces of initial SOI material, the cross-sectional structure is as image 3 Shown.

[0031] The required initial SOI material is two pieces. The surface of the top silicon 110 of the first SOI wafer 101 is a (111) crystal plane, and the thickness is relatively thick, which is the thickness of the coupler input waveguide 301, and the thickness ranges from 3 μm to 15 μm. The crystal orien...

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Abstract

The invention provides a manufacturing method of an SOI base three-dimensional wedgy coupler integrated substrate structure, which is characterized in that the method is realized by silicon micromachining technology. The related initial processing material is SOI material; the selective corrosion characteristic of different crystal surfaces of silicon material is utilized, and micro-electronic relative technology, such as anisotropic etch, bonding, photoetching, dry etching and the like is adopted to obtain SOI base three-dimensional wedgy coupler integrated substrate structure which respectively performs linear change in horizontal and vertical directions; a micro-nano size device zone connected with the output waveguide of the coupler has favorable surface quality, so that the inventioncan effectively improve the coupling efficiency of photonics device, such as general optical fiber, small-size plane waveguide and the like and provides favorable Wiener size photonics devices to prepare integrated substrate structure. The invention is the guarantee for preparing high-quality and high-sensitivity small-size photonics devices and has strong practicality.

Description

Technical field [0001] The invention relates to a method for preparing an SOI (Silicon on Insulator)-based three-dimensional wedge coupler integrated substrate structure based on silicon micromachining technology, and belongs to the field of optoelectronic technology. Background technique [0002] Since the 1960s, optoelectronic integration has achieved considerable development. The main trend of integrated circuit development is the miniaturization of integrated systems. Among the many waveguide materials used in the communication band, the unique sandwich structure of SOI material has unique advantages in the preparation of optoelectronic devices. The refractive indexes of silicon and silicon dioxide materials are 3.45 and 1.4 respectively, and the high contrast refractive index is greatly improved. The transmission efficiency of optical signals in SOI-based optoelectronic devices, while SiO 2 The refractive index of the material is very similar to that of air (refractive inde...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B6/13G02B6/12
Inventor 杨志峰方娜武爱民王曦
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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