Device and method for measuring superconducting transition temperature of high temperature superconducting material
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 北京鼎臣世纪超导科技有限公司
- Publication Date
- 2012-01-04
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Abstract
Description
technical field
[0001] The invention relates to the field of superconducting electronics, in particular to a measuring device and a measuring method for measuring the superconducting transition temperature of high-temperature superconducting materials. Background technique
[0002] The preparation technology of high-temperature superconducting materials has been relatively mature at present, and the indicators for judging their performance include transition temperature Tc, critical current characteristic Jc, and superconducting surface microwave resistance Rc, etc. The superconducting transition temperature Tc is a measure of the high-temperature superconducting film sample. One of the main indicators of performance, having a high superconducting transition temperature is a prerequisite for the large-scale application of superconducting materials and superconducting technology.
[0003] At present, there are two main methods for measuring the superconducting transition temp...