Plasma density measuring equipment of high temperature resistant embedded double-probe type

A plasma and density measurement technology, applied in the direction of measuring devices, measuring electrical variables, measuring current/voltage, etc., to achieve the effect of improving plasma shape measurement, improving measurement accuracy, and high measurement accuracy

Active Publication Date: 2014-02-19
BEIJING RES INST OF TELEMETRY
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the main disadvantages of electrostatic probes (Langmuir probes) are that the effective collection area is difficult to determine, the resistance to high temperature and oxidation is poor, and the aerodynamic shape of the aircraft is affected.

Method used

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  • Plasma density measuring equipment of high temperature resistant embedded double-probe type
  • Plasma density measuring equipment of high temperature resistant embedded double-probe type
  • Plasma density measuring equipment of high temperature resistant embedded double-probe type

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Embodiment Construction

[0022] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0023] Such as figure 1 Shown is the structural schematic diagram of the plasma density measuring device of the present invention, it can be known from the figure that the measuring device comprises a boron nitride insulating base 1, two iridium electrode probes 2,5, two probe electrode guard rings 3,4 and two The electrodes are connected with wires 6,7. Among them, the insulating base 1 is made of boron nitride, and its insulation resistance is as high as 10 14 Ω-cm, in addition, it has high thermal conductivity and processability.

[0024] Two iridium electrode probes 2, 5 are embedded in the boron nitride insulating base 1, the first probe electrode guard ring 3 surrounds the first iridium electrode probe 2, and the second probe electrode guard ring 4 surrounds the second iridium electrode probe Around the electrode probe 5, and the dista...

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Abstract

The invention relates to a plasma density measuring equipment of high temperature resistant embedded double-probe type, which is used for measuring plasmas with a density of 108 to 1011 centimeters <-3> around an aircraft during reentry flying and mainly consists of two iridium electrode probes, two probe electrode protection rings, a boron nitride insulating base, two electrode connection wires and a detection circuit, wherein metal iridium is used as the an electrode of the embedded double probes and boron nitride is used as an insulating electrode; the probe electrode protection rings are set to reduce edge effects and enhance measuring precision; the distances between the probe electrode protection rings and the iridium electrode probes are less than or equal to the Debye length. The measuring equipment disclosed by the invention can be mounted on the surface of a reentry aircraft directly for real-time measuring the density of the plasmas in a boarder layer continuously; the probes are oxidation resisting; the aerodynamic shape of the aircraft cannot be affected, so that the density measuring equipment is capable of measuring continuously for a long time, small in volume and high in precision.

Description

technical field [0001] The invention belongs to the field of space plasma parameter measurement, and relates to a high-temperature-resistant embedded dual-probe plasma density measurement device, which can be used for re-entry flights with a boundary layer density of 10 8 cm -3 ~10 11 cm -3 Measurement of space plasma parameters. Background technique [0002] Whether it is a manned spacecraft, a recovered satellite or an intercontinental missile, the terminal phase system after re-entering the atmosphere has many commands, such as language communication, electronic countermeasures, terminal guidance, etc., all of which require real-time transmission of signals. For different types of re-entry vehicles, the shape and parameters of the plasma sheath are different, theoretical research can only give directional conclusions, and the design proposed based on these conclusions must pass the final verification of the flight test. A major defect of the ground test is that it ca...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R19/00
Inventor 周建发
Owner BEIJING RES INST OF TELEMETRY
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