Complementary-measurement time resolution single-photon spectrum counting imaging system and method

A time-resolved, complementary measurement technology, applied in correlation spectroscopy, spectrum investigation, instruments, etc., can solve the problems of limited wavelength response range, narrow response spectrum range, and high cost, achieve wide wavelength coverage, improve reconstruction accuracy, The effect of saving probe dimensions

Active Publication Date: 2013-01-30
NAT SPACE SCI CENT CAS
View PDF4 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the bin detector detects the extremely weak light, it needs to be exposed for a certain time (that is, the integration time). The light intensity value on this pixel has a sensitivity problem
Among them, ICCD and EMCCD claim to be able to achieve single photon detection, but they need deep semiconductor cooling, which is expensive, ICCD has poor spatial resolution, and the time resolution accuracy reaches nanosecond level, while EMCCD has slightly better spatial resolution, but the time resolution can only reach nanosecond level. On the order of milliseconds, the common problem is that it is difficult to control the noise of the instrument or output linearly under low light; while APDs can work in Geiger mode, but it is still in the research stage, and it i

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Complementary-measurement time resolution single-photon spectrum counting imaging system and method
  • Complementary-measurement time resolution single-photon spectrum counting imaging system and method
  • Complementary-measurement time resolution single-photon spectrum counting imaging system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0054] The present invention will be further described in detail below in conjunction with the accompanying drawings.

[0055]The present invention provides a time-resolved single-photon spectral counting imaging system for complementary measurement. The system is mainly based on compressive sensing theory and is used for simultaneous spectral imaging of visible light and near-infrared light components of objects with transient periodicity and dynamic changes. Output a sequence of color video frames in chronological order, and calculate time-resolved spectrograms for spectral analysis. The system includes: pulsed lasers, optical imaging components, spatial light modulators, two sets of light-receiving collimation components, and two sets of spectral splitters Components, visible light single-photon detector line array, near-infrared light single-photon detector line array, multi-channel counter, random number generator, delayer, system control platform, data read-write memory, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a complementary-measurement time resolution single-photon spectrum counting imaging system and method. The system consists of an optical portion and an electric portion, the optical portion images light on a spatial light modulator, light is modulated and then emitted to two arm directions to be aligned and split, and the electric portion completes detection, control, calculation and the like. The method includes that invisible light and near infrared single-photon detector linear arrays simultaneously detect spectrums of emergent light of two arms of the spatial light modulator, one arm detects visible light spectrum while the other arm detects near infrared spectrum, complementary measurement, maximum luminous flux and high sensitivity can be realized; picosecond time resolution of a periodic object is realized by means of time amplitude variation or delay gate width counting, and second time resolution of a non-periodic object is realized by means of measurement frame by frame; color video frame sequences of visible light and near infrared light can be obtained simultaneously by means of associated compression sensing algorithm according to matrix complementation, and imaging quality is improved while imaging speed is increased; and time resolution spectrograms are counted up for spectral analysis.

Description

technical field [0001] The invention relates to the technical field of time-resolved imaging spectroscopy, in particular to a time-resolved single-photon spectrum counting imaging system and method for complementary measurement. Background technique [0002] In high-tech fields such as time-resolved imaging spectroscopy, biological component detection, starry sky detection, night vision, remote sensing imaging, medical imaging, quantum dot imaging, etc., there is a demand for time-resolved simultaneous detection of visible light spectrum and near-infrared light spectrum It is becoming more and more obvious that, in addition, the traditional time-resolved imaging spectrometer has the defect that the spatial resolution and time resolution cannot meet the high precision at the same time, and imaging and spectroscopy generally require two special instruments to complete, and the response range of the spectrum is also very limited. A new time-resolved imaging system is needed to ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01J3/457G01J11/00
Inventor 翟光杰王超赵清俞文凯刘雪峰
Owner NAT SPACE SCI CENT CAS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products