Preparation method for silicon nitride matrix
A technology of silicon nitride substrate and silicon source is applied in the field of preparation of silicon nitride substrate, which can solve the problem of low performance of ceramic substrate, and achieve the effects of excellent mechanical properties, strong bonding and strong designability.
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Embodiment 1
[0027] (1) Choose T300 2-dimensional plain weave carbon cloth, and cut the carbon cloth into small specimens with a plane size of 50mm×50mm as the base material;
[0028] (2) Hang the above-mentioned base material on the sample holder of the vacuum furnace, and the sample is in the center of the isothermal zone in the furnace;
[0029] (3) Using CVD / CVI method to prepare Si with uniform thickness on the substrate 3 N 4 , The precursor is MTS-NH 3 -H 2 -Ar, H 2 Carrier gas and NH 3 The flow ratio is 5:3, H 2 The dilution ratio of the total amount to MTS is 10.2:1, the reaction temperature is 900°C, the holding time is 7 hours, and the furnace pressure is 400 Pa.
Embodiment 2
[0031] (1) Use porous Si 3 N 4 The ceramic substrate is pre-processed according to the size of 22.86mm×10.16mm×2.2mm, and the surface of the molded substrate is ground and polished as the base material;
[0032] (2) Hang the above-mentioned base material on the sample holder of the vacuum furnace, and the sample is in the center of the isothermal zone in the furnace;
[0033] (3) Using CVD / CVI method to prepare Si with uniform thickness on the substrate 3 N 4 , The precursor is MTS-NH 3 -H 2 -Ar, H 2 Carrier gas and NH 3 The flow ratio is 5:3, H 2 The dilution ratio of the total amount to MTS is 8:1, the reaction temperature is 1200°C, the holding time is 7 hours, and the pressure in the furnace is 400Pa;
[0034] Using waveguide method to Si 3 N 4 -Si 3 N 4 Dielectric properties of multiphase ceramics are tested, and the test frequency is 8.2-12.4GHz.
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