Si/CoSi2 substrate material on imaging insulation body and preparing method thereof
A technology of substrate material and insulator, which is applied in the field of Si/CoSi2 substrate material on patterned insulator and its preparation, can solve the problems of increasing the thickness of the top layer silicon, occupying the space of the top layer silicon, increasing the breakdown voltage of the substrate, etc., and achieves simplification Process, reduced thickness, the effect of simple process
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Embodiment 1
[0036] Such as Figure 1 to Figure 11 As shown, the present invention provides a patterned Si / CoSi on insulator 2 The preparation method of substrate material, described preparation method comprises the following steps at least:
[0037] see Figure 1 to Figure 4 , as shown in the figure, step 1) is first carried out to provide a first Si substrate 111, which is a common silicon wafer, and then standard wet chemical treatment is performed on the first Si substrate 111. cleaning method to remove impurity ions and surface defects on the surface, and form a photoresist 112 on the surface of the first Si substrate 111 to be prepared in the MOS device region. The photoresist 112 is a positive photoresist. A Co layer 113 is formed on the surface of the first Si substrate 111 and the photoresist surface 112 by a deposition method in a vacuum environment, and then a Ti layer 114 is deposited on the Co layer 113, and the Co layer 113 The thickness of the Ti layer is 15-30nm, and the ...
Embodiment 2
[0043] see Figure 1 to Figure 11 , as shown in the figure, the patterned Si / CoSi-on-insulator 2 The basic steps of the preparation method of the substrate material are as in Example 1, the photoresist 112 is reversed, the thickness of the Co layer 113 is 15 nm, and the thickness of the Ti layer 114 is 5 nm. The first annealing temperature is 500°C, the second annealing temperature is 800°C, and the third annealing temperature is 400°C.
[0044] see Figure 11 , as shown in the figure, the patterned Si / CoSi-on-insulator 2 The basic structure of the substrate material is as in embodiment 1, wherein the CoSi 2 Layer 115 has a thickness of 30 nm. The thickness of the Si top layer 111 is 20nm.
Embodiment 3
[0046] see Figure 1 to Figure 11 , as shown in the figure, the patterned Si / CoSi-on-insulator 2 The basic steps of the preparation method of the substrate material are as in Example 1, wherein the photoresist 112 is positive resist, the thickness of the Co layer 113 is 30 nm, and the thickness of the Ti layer 114 is 10 nm. The first annealing temperature is 600°C, the second annealing temperature is 900°C, and the third annealing temperature is 600°C.
[0047] see Figure 11 , as shown in the figure, the patterned Si / CoSi-on-insulator 2 The basic structure of the substrate material is as in embodiment 1, wherein the CoSi 2 Layer 115 has a thickness of 150 nm. The thickness of the Si top layer 111 is 200nm.
[0048] In summary, the patterned Si / CoSi on insulator of the present invention 2 Substrate material and its preparation method A patterned metal Co layer is produced by lift-on technology, and then the Co layer is reacted with the Si substrate twice to form CoSi 2 ...
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Abstract
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